Radiation effects on JFETS, MOSFETS, and bipolar transistors, as related to SSC circuit design

E. J. Kennedy, G. T. Alley, C. L. Britton, P. L. Skubic, B. Gray, A. Wu

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

Some results of radiation effects on selected junction field-effect transistors, MOS field-effect transistors, and bipolar junction transistors are pre.

Original languageEnglish
Pages (from-to)452-457
Number of pages6
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume307
Issue number2-3
DOIs
StatePublished - Oct 1 1991

Funding

The operating environment anticipated for the Superconducting Super Collider (SSC) is a very harsh operating regime. The proposed event period of 16 ns demands very high frequency performance from electronic circuits, yet the need for thousands of circuits absolutely requires a low power operating budget. Additionally, an absolute limitation to circuit performance is the radiation due primarily to gamma and neutron bombardments that can exceed a total dose of 1 Mrad (gamma) and 1013 neutrons/cm 2 in a typical year of operation, dependent upon the distance from the beam \[1\]. This article reports research conducted at the Oak Ridge National Laboratory (ORNL) =1 and The University of Tennessee, Knoxville, which was primarily concerned with gamma radiation total-dose effects on * This research was funded by the DOE SSC Generic Detec-tor Program. ~*l The Oak Ridge National Laboratory is operated for the U.S. Department of Energy by Martin Marietta Energy Systems under contract No. DE-AC05-84OR21400.

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