Abstract
Substantial changes in the radial distribution function of amorphous Si films have been observed in neutron-diffraction studies. The spectra indicate changes in short-range order associated with an 11% modification in the bond-angle distribution width. The results allow the first direct comparison of structural and vibrational Raman probes of variations in local order in thin-film amorphous solids. Good agreement is obtained between the measured bond-angle variation and that based on Raman estimates.
| Original language | English |
|---|---|
| Pages (from-to) | 5527-5530 |
| Number of pages | 4 |
| Journal | Physical Review B |
| Volume | 39 |
| Issue number | 8 |
| DOIs | |
| State | Published - 1989 |