Abstract
Substantial changes in the radial distribution function of amorphous Si films have been observed in neutron-diffraction studies. The spectra indicate changes in short-range order associated with an 11% modification in the bond-angle distribution width. The results allow the first direct comparison of structural and vibrational Raman probes of variations in local order in thin-film amorphous solids. Good agreement is obtained between the measured bond-angle variation and that based on Raman estimates.
Original language | English |
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Pages (from-to) | 5527-5530 |
Number of pages | 4 |
Journal | Physical Review B |
Volume | 39 |
Issue number | 8 |
DOIs | |
State | Published - 1989 |
Externally published | Yes |