Abstract
We have studied the structural stability of thin silver films with thicknesses of N = 1 to 15 monolayers, deposited on an Fe(100) substrate. Photoemission spectroscopy results show that films of N = 1, 2, and 5 monolayer thicknesses are structurally stable for temperatures above 800 kelvin, whereas films of other thicknesses are unstable and bifurcate into a film with N ± 1 monolayer thicknesses at temperatures around 400 kelvin. The results are in agreement with theoretical predictions that consider the electronic energy of the quantum well associated with a particular film thickness as a significant contribution to the film stability.
Original language | English |
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Pages (from-to) | 1131-1133 |
Number of pages | 3 |
Journal | Science |
Volume | 292 |
Issue number | 5519 |
DOIs | |
State | Published - May 11 2001 |
Externally published | Yes |