Quantum electronic stability of atomically uniform films

The valence electronic states in thin films are quantized by the films' boundaries. This represents a substantial modification of the band structure of the system which influences all physical properties. Dramatic variations in thermal stability are observed in thin metallic films on an atomic layer-by-layer basis. This chapter describes measurements of morphology, stability, and electronic structure of thin metallic films using angle-resolved photoemission spectroscopy, and discusses theoretical models that can predict stability based on the quantization of states. Further measurements using x-ray diffraction extend these results to structures more complex than uniform films.