Quantitative Nanometer-Scale Mapping of Dielectric Tunability

Alexander Tselev, Andreas Klein, Jürgen Gassmann, Stephen Jesse, Qian Li, Sergei V. Kalinin, Nina Balke

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

Two scanning probe microscopy techniques - near-field scanning microwave microscopy (SMM) and piezoresponse force microscopy (PFM) - are used to characterize and image tunability in a thin (Ba,Sr)TiO3 film with nanometer scale spatial resolution. While sMIM allows direct probing of tunability by measurement of the change in the dielectric constant, in PFM, tunability can be extracted via electrostrictive response. The near-field microwave imaging and PFM provide similar information about dielectric tunability with PFM capable to deliver quantitative information on tunability with a higher spatial resolution close to 15 nm. This is the first time, information about the dielectric tunability is available on such length scales.

Original languageEnglish
Article number1500088
JournalAdvanced Materials Interfaces
Volume2
Issue number15
DOIs
StatePublished - Oct 1 2015

Keywords

  • dieletrics
  • electrostriction
  • mapping
  • near-field microwave microscopy
  • permittivity
  • piezoresponse force microscopy

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