Quantitative high-resolution electron microscopy of interfaces

F. Ernst, D. Hofmann, K. Nadarzinski, C. Schmidt, S. Stemmer, S. K. Streiffer

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

Quantitative evaluation rather than visual inspection of HRTEM images provides objective, reproducible, and very accurate information on the atomistic structure of internal interfaces. To demonstrate the power of such 'quantitative HRTEM' this paper presents analyses of particular grain boundary structures: Domain boundaries in PbTiO3, and 'incoherent' twin boundaries in Cu and NiAl. In each case the atomistic structure has been determined not only with high precision but also within well-defined error limits. Thus, the experimental results provide sensitive tests for physical theories and model structures obtained by computer simulation.

Original languageEnglish
Pages (from-to)23-34
Number of pages12
JournalMaterials Science Forum
Volume207-209
Issue numberPART 1
DOIs
StatePublished - 1996
Externally publishedYes

Keywords

  • Atomistic Structure
  • Domain Boundaries
  • Quantitative HRTEM
  • Twin Boundaries

Fingerprint

Dive into the research topics of 'Quantitative high-resolution electron microscopy of interfaces'. Together they form a unique fingerprint.

Cite this