Quantitative determination of tip parameters in piezoresponse force microscopy

Sergei V. Kalinin; Stephen Jesse; Brian J. Rodriguez; Eugene A. Eliseev; Venkatraman Gopalan; Anna N. Morozovska

doi:10.1063/1.2742900

Quantitative determination of tip parameters in piezoresponse force microscopy

Sergei V. Kalinin, Stephen Jesse, Brian J. Rodriguez, Eugene A. Eliseev, Venkatraman Gopalan, Anna N. Morozovska

Center for Nanophase Matls Sciences

Research output: Contribution to journal › Article › peer-review

30 Scopus citations

Abstract

One of the key limiting factors in the quantitative interpretation of piezoresponse force microscopy (PFM) is the lack of knowledge on the effective tip geometry. Here the authors derive analytical expressions for a 180° domain wall profile in PFM for the point charge, sphere plane, and disk electrode models of the tip. An approach for the determination of the effective tip parameters from the wall profile is suggested and illustrated for several ferroelectric materials. The calculated tip parameters can be used self-consistently for the interpretation of PFM resolution and spectroscopy data, i.e., linear imaging processes.

Original language	English
Article number	212905
Journal	Applied Physics Letters
Volume	90
Issue number	21
DOIs	https://doi.org/10.1063/1.2742900
State	Published - 2007

Funding

Research supported by Division of Materials Science and Engineering, Oak Ridge National Laboratory, managed by UT-Battelle, LLC, for the U.S. Department of Energy under Contract No. DE-AC05-00OR22725. VG would like to acknowledge support from NSF-DMR Grant Nos. 0507146, 0512165, 2132623 and 0602986.

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10.1063/1.2742900

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AB - One of the key limiting factors in the quantitative interpretation of piezoresponse force microscopy (PFM) is the lack of knowledge on the effective tip geometry. Here the authors derive analytical expressions for a 180° domain wall profile in PFM for the point charge, sphere plane, and disk electrode models of the tip. An approach for the determination of the effective tip parameters from the wall profile is suggested and illustrated for several ferroelectric materials. The calculated tip parameters can be used self-consistently for the interpretation of PFM resolution and spectroscopy data, i.e., linear imaging processes.

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Quantitative determination of tip parameters in piezoresponse force microscopy

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