Quantitative aberration-corrected STEM for studies of oxide superlattices and topological defects in layered ferroelectrics

Albina Borisevich; Rama Vasudevan; Yu Zhou; Kyle Kelley; Donovan Leonard; Summayya Kouser; Sabine Neumayer; Peter Maksymovych; Sokrates Pantelides; Steven May; Nina Balke

doi:10.1017/S1431927620017298

Quantitative aberration-corrected STEM for studies of oxide superlattices and topological defects in layered ferroelectrics

Albina Borisevich, Rama Vasudevan, Yu Zhou, Kyle Kelley, Donovan Leonard, Summayya Kouser, Sabine Neumayer, Peter Maksymovych, Sokrates Pantelides, Steven May, Nina Balke

Research output: Contribution to journal › Comment/debate

Original language	English
Journal	Microscopy and Microanalysis
DOIs	https://doi.org/10.1017/S1431927620017298
State	Accepted/In press - 2020

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@article{1647d66f27ea418bb0130593aef3956e,

title = "Quantitative aberration-corrected STEM for studies of oxide superlattices and topological defects in layered ferroelectrics",

author = "Albina Borisevich and Rama Vasudevan and Yu Zhou and Kyle Kelley and Donovan Leonard and Summayya Kouser and Sabine Neumayer and Peter Maksymovych and Sokrates Pantelides and Steven May and Nina Balke",

year = "2020",

doi = "10.1017/S1431927620017298",

language = "English",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

}

TY - JOUR

T1 - Quantitative aberration-corrected STEM for studies of oxide superlattices and topological defects in layered ferroelectrics

AU - Borisevich, Albina

AU - Vasudevan, Rama

AU - Zhou, Yu

AU - Kelley, Kyle

AU - Leonard, Donovan

AU - Kouser, Summayya

AU - Neumayer, Sabine

AU - Maksymovych, Peter

AU - Pantelides, Sokrates

AU - May, Steven

AU - Balke, Nina

PY - 2020

Y1 - 2020

UR - http://www.scopus.com/inward/record.url?scp=85094850957&partnerID=8YFLogxK

U2 - 10.1017/S1431927620017298

DO - 10.1017/S1431927620017298

M3 - Comment/debate

AN - SCOPUS:85094850957

SN - 1431-9276

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -

Quantitative aberration-corrected STEM for studies of oxide superlattices and topological defects in layered ferroelectrics

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