Quantifying polarization fields and sheet charge in III-nitride HEMT devices using off-axis electron holography

M. R. Johnson, D. A. Cullen, D. J. Smith, L. Zhou, M. R. McCartney

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1832-1833
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	18
DOIs	https://doi.org/10.1017/S1431927612011014
State	Published - Jul 2012

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@article{147065e2e195446194b203e1ab0c8814,

title = "Quantifying polarization fields and sheet charge in III-nitride HEMT devices using off-axis electron holography",

author = "Johnson, {M. R.} and Cullen, {D. A.} and Smith, {D. J.} and L. Zhou and McCartney, {M. R.}",

year = "2012",

month = jul,

doi = "10.1017/S1431927612011014",

language = "English",

volume = "18",

pages = "1832--1833",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

}

TY - JOUR

T1 - Quantifying polarization fields and sheet charge in III-nitride HEMT devices using off-axis electron holography

AU - Johnson, M. R.

AU - Cullen, D. A.

AU - Smith, D. J.

AU - Zhou, L.

AU - McCartney, M. R.

PY - 2012/7

Y1 - 2012/7

UR - http://www.scopus.com/inward/record.url?scp=85007955408&partnerID=8YFLogxK

U2 - 10.1017/S1431927612011014

DO - 10.1017/S1431927612011014

M3 - Article

AN - SCOPUS:85007955408

SN - 1431-9276

VL - 18

SP - 1832

EP - 1833

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -