Pushing the limits of electron ptychography: Subatomic probe sizes in convergent-beam electron microscopy offer new opportunities

Andrew R. Lupini; Mark P. Oxley; Sergei V. Kalinin

doi:10.1126/science.aau7620

Pushing the limits of electron ptychography: Subatomic probe sizes in convergent-beam electron microscopy offer new opportunities

Andrew R. Lupini, Mark P. Oxley, Sergei V. Kalinin

electron Microscopy and Microanalysis

Research output: Contribution to journal › Review article › peer-review

15 Scopus citations

Original language	English
Pages (from-to)	399-400
Number of pages	2
Journal	Science
Volume	362
Issue number	6413
DOIs	https://doi.org/10.1126/science.aau7620
State	Published - Oct 26 2018

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10.1126/science.aau7620

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title = "Pushing the limits of electron ptychography: Subatomic probe sizes in convergent-beam electron microscopy offer new opportunities",

author = "Lupini, \{Andrew R.\} and Oxley, \{Mark P.\} and Kalinin, \{Sergei V.\}",

year = "2018",

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language = "English",

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T1 - Pushing the limits of electron ptychography

T2 - Subatomic probe sizes in convergent-beam electron microscopy offer new opportunities

AU - Lupini, Andrew R.

AU - Oxley, Mark P.

AU - Kalinin, Sergei V.

PY - 2018/10/26

Y1 - 2018/10/26

UR - https://www.scopus.com/pages/publications/85055618205

U2 - 10.1126/science.aau7620

DO - 10.1126/science.aau7620

M3 - Review article

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VL - 362

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JO - Science

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IS - 6413

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Pushing the limits of electron ptychography: Subatomic probe sizes in convergent-beam electron microscopy offer new opportunities

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