Original language | English |
---|---|
Pages (from-to) | 399-400 |
Number of pages | 2 |
Journal | Science |
Volume | 362 |
Issue number | 6413 |
DOIs | |
State | Published - Oct 26 2018 |
Pushing the limits of electron ptychography: Subatomic probe sizes in convergent-beam electron microscopy offer new opportunities
Andrew R. Lupini, Mark P. Oxley, Sergei V. Kalinin
Research output: Contribution to journal › Review article › peer-review
11
Scopus
citations