TY - JOUR
T1 - Ptychographic Imaging of Nano-Materials at the Advanced Light Source with the Nanosurveyor Instrument
AU - Shapiro, David A.
AU - Celestre, Rich
AU - Denes, Peter
AU - Farmand, Maryam
AU - Joseph, John
AU - Kilcoyne, A. L.D.
AU - Marchesini, Stefano
AU - Padmore, Howard
AU - Venkatakrishnan, Singanallur V.
AU - Warwick, Tony
AU - Yu, Young Sang
N1 - Publisher Copyright:
© Published under licence by IOP Publishing Ltd.
PY - 2017/6/14
Y1 - 2017/6/14
N2 - We present a new ptychographic x-ray microscope dedicated to soft x-ray tomography and spectromicroscopy of nano-materials at the Advanced Light Source. The microscope utilizes an ultra-stable, high performance scanning mechanism with laser interferometer feedback for sample positioning and a fast frame rate charge-coupled device detector for soft x-ray diffraction measurements. The microscope can achieve point scan rates of 120 Hz with 1 nm RMS positioning accuracy. A high performance data pipeline has been developed which enables real time ptychographic reconstructions and user-friendly operation. This instrument, called The Nanosurveyor, can achieve a spatial resolution at least 10 times finer than the x-ray spot size in both two and three dimensions with sensitivity to electronicand magnetic states of nano-materials. In this paper we demonstrate the tomographic and spectromicroscopic capability of the Nanosurveyor instrument. At high brightness x-ray sources this instrument will enable spectromicroscopy and tomography of materials with diffraction limited spatial resolution.
AB - We present a new ptychographic x-ray microscope dedicated to soft x-ray tomography and spectromicroscopy of nano-materials at the Advanced Light Source. The microscope utilizes an ultra-stable, high performance scanning mechanism with laser interferometer feedback for sample positioning and a fast frame rate charge-coupled device detector for soft x-ray diffraction measurements. The microscope can achieve point scan rates of 120 Hz with 1 nm RMS positioning accuracy. A high performance data pipeline has been developed which enables real time ptychographic reconstructions and user-friendly operation. This instrument, called The Nanosurveyor, can achieve a spatial resolution at least 10 times finer than the x-ray spot size in both two and three dimensions with sensitivity to electronicand magnetic states of nano-materials. In this paper we demonstrate the tomographic and spectromicroscopic capability of the Nanosurveyor instrument. At high brightness x-ray sources this instrument will enable spectromicroscopy and tomography of materials with diffraction limited spatial resolution.
UR - http://www.scopus.com/inward/record.url?scp=85022078163&partnerID=8YFLogxK
U2 - 10.1088/1742-6596/849/1/012028
DO - 10.1088/1742-6596/849/1/012028
M3 - Conference article
AN - SCOPUS:85022078163
SN - 1742-6588
VL - 849
JO - Journal of Physics: Conference Series
JF - Journal of Physics: Conference Series
IS - 1
M1 - 012028
T2 - 13th International X-ray Microscopy Conference, XRM 2016
Y2 - 15 August 2016 through 19 August 2016
ER -