Prospects for single atom location and identification with aberration-corrected STEM

A. R. Lupini; M. Varela; A. Y. Borisevich; Y. Peng; S. J. Pennycook

Prospects for single atom location and identification with aberration-corrected STEM

A. R. Lupini, M. Varela, A. Y. Borisevich, Y. Peng, S. J. Pennycook

electron Microscopy and Microanalysis

Research output: Contribution to journal › Conference article › peer-review

Abstract

The prospects for the location and identification of single atoms will be examined. It will be shown how aberration correction is becoming an established and essential tool for increasing the sensitivity in electron microscopy. It will be demonstrated that the STEM provides some unique advantages for the detection and electronic analysis of very small quantities of dopant atoms in the bulk of a sample.

Original language	English
Pages (from-to)	523-532
Number of pages	10
Journal	Design and Nature
Volume	6
State	Published - 2004
Event	Design and Nature II: Comparing Design in Nature with Science and Engineering - Rhodes, Greece Duration: Jun 28 2004 → Jun 30 2004

Cite this

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title = "Prospects for single atom location and identification with aberration-corrected STEM",

abstract = "The prospects for the location and identification of single atoms will be examined. It will be shown how aberration correction is becoming an established and essential tool for increasing the sensitivity in electron microscopy. It will be demonstrated that the STEM provides some unique advantages for the detection and electronic analysis of very small quantities of dopant atoms in the bulk of a sample.",

author = "Lupini, {A. R.} and M. Varela and Borisevich, {A. Y.} and Y. Peng and Pennycook, {S. J.}",

year = "2004",

language = "English",

volume = "6",

pages = "523--532",

journal = "Design and Nature",

issn = "1478-0585",

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TY - JOUR

T1 - Prospects for single atom location and identification with aberration-corrected STEM

AU - Lupini, A. R.

AU - Varela, M.

AU - Borisevich, A. Y.

AU - Peng, Y.

AU - Pennycook, S. J.

PY - 2004

Y1 - 2004

N2 - The prospects for the location and identification of single atoms will be examined. It will be shown how aberration correction is becoming an established and essential tool for increasing the sensitivity in electron microscopy. It will be demonstrated that the STEM provides some unique advantages for the detection and electronic analysis of very small quantities of dopant atoms in the bulk of a sample.

AB - The prospects for the location and identification of single atoms will be examined. It will be shown how aberration correction is becoming an established and essential tool for increasing the sensitivity in electron microscopy. It will be demonstrated that the STEM provides some unique advantages for the detection and electronic analysis of very small quantities of dopant atoms in the bulk of a sample.

UR - http://www.scopus.com/inward/record.url?scp=7744222089&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:7744222089

SN - 1478-0585

VL - 6

SP - 523

EP - 532

JO - Design and Nature

JF - Design and Nature

T2 - Design and Nature II: Comparing Design in Nature with Science and Engineering

Y2 - 28 June 2004 through 30 June 2004

ER -

Prospects for single atom location and identification with aberration-corrected STEM

Abstract

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