Propagation of priors for more accurate and efficient spectroscopic functional fits and their application to ferroelectric hysteresis

Engineering

• Functional Form 100%
• Parameter Estimation 100%
• Current-Voltage Characteristic 100%
• Hysteresis Loop 50%
• Model Parameter 50%
• Spatial Domain 50%
• Noisy Environment 50%
• Spectral Domain 50%
• Individual Case 50%
• Measured Spectrum 50%
• Thin Films 50%
• Parameter Space 50%
• Hierarchical Clustering 50%
• Tunnel Construction 50%
• Conductive Atomic Force Microscopy 50%

Material Science

• Ferroelectric Material 100%
• Current-Voltage Characteristic 66%
• Atomic Force Microscopy 33%
• Materials Property 33%
• Scanning Electron Microscopy 33%
• Scanning Probe Microscopy 33%
• Thin Films 33%

Mathematics

• Parameter Estimation 100%
• Functional Form 100%
• Parameter Space 50%
• Hierarchical Clustering 50%