Abstract
Registration of radiographic and computed tomography (CT) data has the potential to allow automated metrology and defect detection. While registration of the three-dimensional reconstructed data is a common task in the medical industry for registration of data sets from multiple detection systems, registration of projection sets has only seen development in the area of tomotherapy. Efforts in projection registration have employed a method named Fourier phase matching (FPM). This work discusses implementation and results for the application of the FPM method to industrial applications for the nondestructive testing (NDT) community. The FPM method has been implemented and modified for industrial application. Testing with simulated and experimental x-ray CT data shows excellent performance with respect to the resolution of the imaging system.
Original language | English |
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Article number | 031208 |
Journal | Journal of Electronic Imaging |
Volume | 19 |
Issue number | 3 |
DOIs | |
State | Published - Jul 2010 |