Profile SP (P-type) HPGe detectors - Premium resolution at low to medium energies

E. G. Roth, Gregor Geurkov, Teresa Underwood, Kyle T. Schmitt

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The resolution performance of a High Purity Germanium (HPGe) gamma-ray detector is a function of three factors: crystal quality and geometry, electronic noise, and any microphonic contribution. Improving detector resolution solves peak overlapping problems in complicated multi-peak spectra and improves the performance of peak identification algorithms yielding fewer false positive results in spectrometry analysis. A new Low Noise Back Contact (LNBC) has been developed by ORTEC® for p-type semi-planar HPGe detectors. This LNBC minimizes electronic noise, while the semi-planar ptype crystal geometry offers premium efficiency and charge collection performance for the 3 keV to 1 MeV energy region, where the majority of nuclides reside. Additionally, semiplanar crystal geometry lowers the Compton region created by higher energy gammas, allowing lower Minimum Detectable Activity (MDA) levels. The "Profile SP" with unmatched premium resolution results will be discussed for various energies and shaping times.

Original languageEnglish
Title of host publication2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509016426
DOIs
StatePublished - Oct 16 2017
Externally publishedYes
Event2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016 - Strasbourg, France
Duration: Oct 29 2016Nov 6 2016

Publication series

Name2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
Volume2017-January

Conference

Conference2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
Country/TerritoryFrance
CityStrasbourg
Period10/29/1611/6/16

Keywords

  • HPGe
  • Low-noise contact
  • ORTEC
  • Semi-planar detector

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