Probing the magnetic profile of diluted magnetic semiconductors using polarized neutron reflectivity

X. Luo; L. T. Tseng; W. T. Lee; T. T. Tan; N. N. Bao; R. Liu; J. Ding; S. Li; V. Lauter; J. B. Yi

doi:10.1038/s41598-017-06793-w

Probing the magnetic profile of diluted magnetic semiconductors using polarized neutron reflectivity

X. Luo, L. T. Tseng, W. T. Lee, T. T. Tan, N. N. Bao, R. Liu, J. Ding, S. Li, V. Lauter, J. B. Yi

Reflectometry

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18 Scopus citations

Abstract

Room temperature ferromagnetism has been observed in the Cu doped ZnO films deposited under an oxygen partial pressure of 10^-3 and 10^-5 torr on Pt (200 nm)/Ti (45 nm)/Si (001) substrates using pulsed laser deposition. Due to the deposition at relatively high temperature (873 K), Cu and Ti atoms diffuse to the surface and interface, which significantly affects the magnetic properties. Depth sensitive polarized neutron reflectometry method provides the details of the composition and magnetization profiles and shows that an accumulation of Cu on the surface leads to an increase in the magnetization near the surface. Our results reveal that the presence of the copper at Zn sites induces ferromagnetism at room temperature, confirming intrinsic ferromagnetism.

Original language	English
Article number	6341
Journal	Scientific Reports
Volume	7
Issue number	1
DOIs	https://doi.org/10.1038/s41598-017-06793-w
State	Published - Dec 1 2017

Funding

This work is funded by Australian Research Council discovery project DP140103041. We highly appreciate the support of H. Ambaye and R. Goyette during the preparation of the equipment for the PNR experiments. The research performed at ORNL's Spallation Neutron Source was sponsored by the Scientific User Facilities Division, Office of Basic Energy Sciences, US Department of Energy.

Funders	Funder number
Scientific User Facilities Division
U.S. Department of Energy
Basic Energy Sciences
Oak Ridge National Laboratory
Australian Research Council	DP140103041

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abstract = "Room temperature ferromagnetism has been observed in the Cu doped ZnO films deposited under an oxygen partial pressure of 10-3 and 10-5 torr on Pt (200 nm)/Ti (45 nm)/Si (001) substrates using pulsed laser deposition. Due to the deposition at relatively high temperature (873 K), Cu and Ti atoms diffuse to the surface and interface, which significantly affects the magnetic properties. Depth sensitive polarized neutron reflectometry method provides the details of the composition and magnetization profiles and shows that an accumulation of Cu on the surface leads to an increase in the magnetization near the surface. Our results reveal that the presence of the copper at Zn sites induces ferromagnetism at room temperature, confirming intrinsic ferromagnetism.",

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AU - Luo, X.

AU - Tseng, L. T.

AU - Lee, W. T.

AU - Tan, T. T.

AU - Bao, N. N.

AU - Liu, R.

AU - Ding, J.

AU - Li, S.

AU - Lauter, V.

AU - Yi, J. B.

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AB - Room temperature ferromagnetism has been observed in the Cu doped ZnO films deposited under an oxygen partial pressure of 10-3 and 10-5 torr on Pt (200 nm)/Ti (45 nm)/Si (001) substrates using pulsed laser deposition. Due to the deposition at relatively high temperature (873 K), Cu and Ti atoms diffuse to the surface and interface, which significantly affects the magnetic properties. Depth sensitive polarized neutron reflectometry method provides the details of the composition and magnetization profiles and shows that an accumulation of Cu on the surface leads to an increase in the magnetization near the surface. Our results reveal that the presence of the copper at Zn sites induces ferromagnetism at room temperature, confirming intrinsic ferromagnetism.

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Probing the magnetic profile of diluted magnetic semiconductors using polarized neutron reflectivity

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