Probing the local atomic structure of Sr-modified Al-Si alloys

P. Srirangam, S. Chattopadhyay, A. Bhattacharya, S. Nag, J. Kaduk, S. Shankar, R. Banerjee, T. Shibata

Research output: Contribution to journalArticlepeer-review

94 Scopus citations

Abstract

Extended X-ray absorption fine structure (EXAFS) spectroscopy and atom probe tomography (APT) measurements were jointly used for the first time to probe the local structure around Sr atoms in Al-10%Sr master alloy and in Al-3%Si-0.04%Sr and Al-12.5%Si-0.04%Sr eutectic alloys in order to study the impact of trace levels of Sr on the morphological changes occurring in Al-Si binary eutectic alloy. EXAFS analysis shows the oxidation states of Sr is close to Sr0 in all the alloys studied. In the Al-10%Sr master alloy, Sr atoms tend to form the intermetallic compound Al4Sr. On the other hand, in Al-Si alloys, Sr atoms segregate towards Si-rich regions, preferentially bonding to Si atoms to form Al2Si2Sr-like clusters with a coordination environment consistent with bulk Al 2Si2Sr. APT study reveals the presence of nanometer-sized Al-rich and Si-rich regions and support the EXAFS results. We speculate that addition of trace levels of Sr to Al-Si binary alloy system results in the initial formation of Al2Si2Sr-like clusters and the presence of such intermetallic clusters could play an important role such as poisoning of nucleation sites, thereby delaying the nucleation of eutectic phases and causing the morphological changes of the eutectic phases in the Al-Si alloys.

Original languageEnglish
Pages (from-to)185-193
Number of pages9
JournalActa Materialia
Volume65
DOIs
StatePublished - Feb 15 2014
Externally publishedYes

Funding

MRCAT operations are supported by the Department of Energy and the MRCAT member institutions. Use of the Advanced Photon Source at Argonne National Laboratory was supported by the US Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357. Authors would like to thank Dr. Jeffrey T. Miller of Argonne National Laboratory for fruitful discussions, Prof. Carlo Segre of Illinois Institute of Technology for support of this research by allocating staff time to beamline scientists; and Dr. Vladislav Zyryanov for his help during the experiments. We thank Dr. Shelly Kelly of EXAFS analysis Inc., USA for her valuable suggestions during EXAFS data analysis.

Keywords

  • Al-Si alloys
  • Atom probe tomography
  • Sr modification
  • X-ray absorption spectroscopy
  • X-ray diffraction

Fingerprint

Dive into the research topics of 'Probing the local atomic structure of Sr-modified Al-Si alloys'. Together they form a unique fingerprint.

Cite this