Probing the crystallography of ordered phases by coupling orientation microscopy and atom probe tomography

S. Meher; P. Nandwana; T. Rojhirunsakool; J. Tiley; R. Banerjee

doi:10.1017/S1431927614006515

Probing the crystallography of ordered phases by coupling orientation microscopy and atom probe tomography

S. Meher, P. Nandwana, T. Rojhirunsakool, J. Tiley, R. Banerjee

Materials Science and Technology Div

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

Original language	English
Pages (from-to)	958-959
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614006515
State	Published - Aug 1 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014

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title = "Probing the crystallography of ordered phases by coupling orientation microscopy and atom probe tomography",

author = "S. Meher and P. Nandwana and T. Rojhirunsakool and J. Tiley and R. Banerjee",

year = "2014",

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doi = "10.1017/S1431927614006515",

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TY - JOUR

T1 - Probing the crystallography of ordered phases by coupling orientation microscopy and atom probe tomography

AU - Meher, S.

AU - Nandwana, P.

AU - Rojhirunsakool, T.

AU - Tiley, J.

AU - Banerjee, R.

PY - 2014/8/1

Y1 - 2014/8/1

UR - https://www.scopus.com/pages/publications/84927927180

U2 - 10.1017/S1431927614006515

DO - 10.1017/S1431927614006515

M3 - Conference article

AN - SCOPUS:84927927180

SN - 1431-9276

VL - 20

SP - 958

EP - 959

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

ER -

Probing the crystallography of ordered phases by coupling orientation microscopy and atom probe tomography

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