Original language | English |
---|---|
Pages (from-to) | 958-959 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 20 |
Issue number | 3 |
DOIs | |
State | Published - Aug 1 2014 |
Externally published | Yes |
Event | Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014 |
Probing the crystallography of ordered phases by coupling orientation microscopy and atom probe tomography
S. Meher, P. Nandwana, T. Rojhirunsakool, J. Tiley, R. Banerjee
Research output: Contribution to journal › Conference article › peer-review
1
Scopus
citations