Probing the crystallography of ordered phases by coupling orientation microscopy and atom probe tomography

S. Meher, P. Nandwana, T. Rojhirunsakool, J. Tiley, R. Banerjee

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations
Original languageEnglish
Pages (from-to)958-959
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
StatePublished - Aug 1 2014
Externally publishedYes
EventMicroscopy and Microanalysis 2014, M and M 2014 - Hartford, United States
Duration: Aug 3 2014Aug 7 2014

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