Probing Temperature-Induced Phase Transitions at Individual Ferroelectric Domain Walls

Kyle P. Kelley; Sergei V. Kalinin; Eugene Eliseev; Shivaranjan Raghuraman; Stephen Jesse; Peter Maksymovych; Anna N. Morozovska

doi:10.1002/aelm.202200552

Probing Temperature-Induced Phase Transitions at Individual Ferroelectric Domain Walls

Kyle P. Kelley, Sergei V. Kalinin, Eugene Eliseev, Shivaranjan Raghuraman, Stephen Jesse, Peter Maksymovych, Anna N. Morozovska

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

Ferroelectric domain walls have emerged as one of the most fascinating objects in condensed matter physics due to the broad variability of functional behaviors they exhibit. However, the vast majority of domain walls studies have been focused on bias-induced dynamics and transport behaviors. Here, the scanning probe microscopy approach based on piezoresponse force microscopy (PFM) with a dynamically heated probe, combining local heating and local biasing of the material is introduced. This approach is used to explore the thermal polarization dynamics in soft Sn₂P₂S₆ ferroelectrics, and allows for the exploration of phase transitions at individual domain walls. The strong and weak modulation regimes for the thermal PFM are introduced. The future potential applications of heated probe approach for functional SPM measurements including piezoelectric, elastic, microwave, and transport measurements are discussed.

Original language	English
Article number	2200552
Journal	Advanced Electronic Materials
Volume	9
Issue number	1
DOIs	https://doi.org/10.1002/aelm.202200552
State	Published - Jan 2023

Funding

This effort including the data analysis and interpretation, was supported as part of the center for 3D Ferroelectric Microelectronics (3DFeM), an Energy Frontier Research Center funded by the U.S. Department of Energy (DOE), Office of Science, Basic Energy Sciences under Award Number DE-SC0021118. The PFM combined with thermal excitation measurements were performed and partially supported at Oak Ridge National Laboratory's Center for Nanophase Materials Sciences (CNMS), a U.S. Department of Energy, Office of Science User Facility. Theory (A.N.M.) was supported by the National Academy of Sciences of Ukraine (the Target Program of Basic Research of the National Academy of Sciences of Ukraine “Prospective basic research and innovative development of nanomaterials and nanotechnologies for 2020–2024,” Project No. 1/20-H, state registration number: 0120U102306) and received funding from the European Union's Horizon 2020 research and innovation programme under the Marie Skłodowska-Curie grant agreement No 778070. This effort including the data analysis and interpretation, was supported as part of the center for 3D Ferroelectric Microelectronics (3DFeM), an Energy Frontier Research Center funded by the U.S. Department of Energy (DOE), Office of Science, Basic Energy Sciences under Award Number DE‐SC0021118. The PFM combined with thermal excitation measurements were performed and partially supported at Oak Ridge National Laboratory's Center for Nanophase Materials Sciences (CNMS), a U.S. Department of Energy, Office of Science User Facility. Theory (A.N.M.) was supported by the National Academy of Sciences of Ukraine (the Target Program of Basic Research of the National Academy of Sciences of Ukraine “Prospective basic research and innovative development of nanomaterials and nanotechnologies for 2020–2024,” Project No. 1/20‐H, state registration number: 0120U102306) and received funding from the European Union's Horizon 2020 research and innovation programme under the Marie Skłodowska‐Curie grant agreement No 778070.

Keywords

domain walls
ferroelectric
local heating
phase transition
piezoresponse force microscopy

Access to Document

10.1002/aelm.202200552

Cite this

@article{a01cfafe1bf940cc8894809b73ebbcb5,

title = "Probing Temperature-Induced Phase Transitions at Individual Ferroelectric Domain Walls",

abstract = "Ferroelectric domain walls have emerged as one of the most fascinating objects in condensed matter physics due to the broad variability of functional behaviors they exhibit. However, the vast majority of domain walls studies have been focused on bias-induced dynamics and transport behaviors. Here, the scanning probe microscopy approach based on piezoresponse force microscopy (PFM) with a dynamically heated probe, combining local heating and local biasing of the material is introduced. This approach is used to explore the thermal polarization dynamics in soft Sn2P2S6 ferroelectrics, and allows for the exploration of phase transitions at individual domain walls. The strong and weak modulation regimes for the thermal PFM are introduced. The future potential applications of heated probe approach for functional SPM measurements including piezoelectric, elastic, microwave, and transport measurements are discussed.",

keywords = "domain walls, ferroelectric, local heating, phase transition, piezoresponse force microscopy",

author = "Kelley, {Kyle P.} and Kalinin, {Sergei V.} and Eugene Eliseev and Shivaranjan Raghuraman and Stephen Jesse and Peter Maksymovych and Morozovska, {Anna N.}",

note = "Publisher Copyright: {\textcopyright} 2022 Oak Ridge National Laboratory, managed by UT-Battelle, LLC and The Authors. Advanced Electronic Materials published by Wiley-VCH GmbH.",

year = "2023",

month = jan,

doi = "10.1002/aelm.202200552",

language = "English",

volume = "9",

journal = "Advanced Electronic Materials",

issn = "2199-160X",

publisher = "Wiley Open Access",

number = "1",

}

TY - JOUR

T1 - Probing Temperature-Induced Phase Transitions at Individual Ferroelectric Domain Walls

AU - Kelley, Kyle P.

AU - Kalinin, Sergei V.

AU - Eliseev, Eugene

AU - Raghuraman, Shivaranjan

AU - Jesse, Stephen

AU - Maksymovych, Peter

AU - Morozovska, Anna N.

PY - 2023/1

Y1 - 2023/1

N2 - Ferroelectric domain walls have emerged as one of the most fascinating objects in condensed matter physics due to the broad variability of functional behaviors they exhibit. However, the vast majority of domain walls studies have been focused on bias-induced dynamics and transport behaviors. Here, the scanning probe microscopy approach based on piezoresponse force microscopy (PFM) with a dynamically heated probe, combining local heating and local biasing of the material is introduced. This approach is used to explore the thermal polarization dynamics in soft Sn2P2S6 ferroelectrics, and allows for the exploration of phase transitions at individual domain walls. The strong and weak modulation regimes for the thermal PFM are introduced. The future potential applications of heated probe approach for functional SPM measurements including piezoelectric, elastic, microwave, and transport measurements are discussed.

AB - Ferroelectric domain walls have emerged as one of the most fascinating objects in condensed matter physics due to the broad variability of functional behaviors they exhibit. However, the vast majority of domain walls studies have been focused on bias-induced dynamics and transport behaviors. Here, the scanning probe microscopy approach based on piezoresponse force microscopy (PFM) with a dynamically heated probe, combining local heating and local biasing of the material is introduced. This approach is used to explore the thermal polarization dynamics in soft Sn2P2S6 ferroelectrics, and allows for the exploration of phase transitions at individual domain walls. The strong and weak modulation regimes for the thermal PFM are introduced. The future potential applications of heated probe approach for functional SPM measurements including piezoelectric, elastic, microwave, and transport measurements are discussed.

KW - domain walls

KW - ferroelectric

KW - local heating

KW - phase transition

KW - piezoresponse force microscopy

UR - http://www.scopus.com/inward/record.url?scp=85139519514&partnerID=8YFLogxK

U2 - 10.1002/aelm.202200552

DO - 10.1002/aelm.202200552

M3 - Article

AN - SCOPUS:85139519514

SN - 2199-160X

VL - 9

JO - Advanced Electronic Materials

JF - Advanced Electronic Materials

IS - 1

M1 - 2200552

ER -

Probing Temperature-Induced Phase Transitions at Individual Ferroelectric Domain Walls

Abstract

Funding

Keywords

Access to Document

Other files and links

Fingerprint

Cite this