Probing surface and bulk electrochemical processes on the LaAlO 3-SrTiO 3 interface

Amit Kumar, Thomas M. Arruda, Yunseok Kim, Ilia N. Ivanov, Stephen Jesse, Chung W. Bark, Nicholas C. Bristowe, Emilio Artacho, Peter B. Littlewood, Chang Beom Eom, Sergei V. Kalinin

Research output: Contribution to journalArticlepeer-review

65 Scopus citations

Abstract

Local electrochemical phenomena on the surfaces of the LaAlO 3-SrTiO 3 heterostructure are explored using unipolar and bipolar dynamic electrochemical strain microscopy (D-ESM). The D-ESM suggests the presence of at least two distinct electrochemical processes, including fast reversible low-voltage process and slow high-voltage process. The latter process is associated with static surface deformations in the sub-nanometer regime. These behaviors are compared with Kelvin probe force microscopy hysteresis data. The possible origins of observed phenomena are discussed, and these studies suggest that charge-writing behavior in LAO-STO includes a strong surface/bulk electrochemical component and is more complicated than simple screening by surface adsorbates.

Original languageEnglish
Pages (from-to)3841-3852
Number of pages12
JournalACS Nano
Volume6
Issue number5
DOIs
StatePublished - May 22 2012

Keywords

  • Charge writing
  • Dynamic strain
  • Electrochemical
  • Microscopy

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