Probing surface and bulk electrochemical processes on the LaAlO 3-SrTiO 3 interface

Amit Kumar; Thomas M. Arruda; Yunseok Kim; Ilia N. Ivanov; Stephen Jesse; Chung W. Bark; Nicholas C. Bristowe; Emilio Artacho; Peter B. Littlewood; Chang Beom Eom; Sergei V. Kalinin

doi:10.1021/nn204960c

Probing surface and bulk electrochemical processes on the LaAlO ₃-SrTiO ₃ interface

Amit Kumar, Thomas M. Arruda, Yunseok Kim, Ilia N. Ivanov, Stephen Jesse, Chung W. Bark, Nicholas C. Bristowe, Emilio Artacho, Peter B. Littlewood, Chang Beom Eom, Sergei V. Kalinin

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66 Scopus citations

Abstract

Local electrochemical phenomena on the surfaces of the LaAlO ₃-SrTiO ₃ heterostructure are explored using unipolar and bipolar dynamic electrochemical strain microscopy (D-ESM). The D-ESM suggests the presence of at least two distinct electrochemical processes, including fast reversible low-voltage process and slow high-voltage process. The latter process is associated with static surface deformations in the sub-nanometer regime. These behaviors are compared with Kelvin probe force microscopy hysteresis data. The possible origins of observed phenomena are discussed, and these studies suggest that charge-writing behavior in LAO-STO includes a strong surface/bulk electrochemical component and is more complicated than simple screening by surface adsorbates.

Original language	English
Pages (from-to)	3841-3852
Number of pages	12
Journal	ACS Nano
Volume	6
Issue number	5
DOIs	https://doi.org/10.1021/nn204960c
State	Published - May 22 2012

Keywords

Charge writing
Dynamic strain
Electrochemical
Microscopy

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10.1021/nn204960c

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title = "Probing surface and bulk electrochemical processes on the LaAlO 3-SrTiO 3 interface",

abstract = "Local electrochemical phenomena on the surfaces of the LaAlO 3-SrTiO 3 heterostructure are explored using unipolar and bipolar dynamic electrochemical strain microscopy (D-ESM). The D-ESM suggests the presence of at least two distinct electrochemical processes, including fast reversible low-voltage process and slow high-voltage process. The latter process is associated with static surface deformations in the sub-nanometer regime. These behaviors are compared with Kelvin probe force microscopy hysteresis data. The possible origins of observed phenomena are discussed, and these studies suggest that charge-writing behavior in LAO-STO includes a strong surface/bulk electrochemical component and is more complicated than simple screening by surface adsorbates.",

keywords = "Charge writing, Dynamic strain, Electrochemical, Microscopy",

author = "Amit Kumar and Arruda, {Thomas M.} and Yunseok Kim and Ivanov, {Ilia N.} and Stephen Jesse and Bark, {Chung W.} and Bristowe, {Nicholas C.} and Emilio Artacho and Littlewood, {Peter B.} and Eom, {Chang Beom} and Kalinin, {Sergei V.}",

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doi = "10.1021/nn204960c",

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journal = "ACS Nano",

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TY - JOUR

T1 - Probing surface and bulk electrochemical processes on the LaAlO 3-SrTiO 3 interface

AU - Kumar, Amit

AU - Arruda, Thomas M.

AU - Kim, Yunseok

AU - Ivanov, Ilia N.

AU - Jesse, Stephen

AU - Bark, Chung W.

AU - Bristowe, Nicholas C.

AU - Artacho, Emilio

AU - Littlewood, Peter B.

AU - Eom, Chang Beom

AU - Kalinin, Sergei V.

PY - 2012/5/22

Y1 - 2012/5/22

N2 - Local electrochemical phenomena on the surfaces of the LaAlO 3-SrTiO 3 heterostructure are explored using unipolar and bipolar dynamic electrochemical strain microscopy (D-ESM). The D-ESM suggests the presence of at least two distinct electrochemical processes, including fast reversible low-voltage process and slow high-voltage process. The latter process is associated with static surface deformations in the sub-nanometer regime. These behaviors are compared with Kelvin probe force microscopy hysteresis data. The possible origins of observed phenomena are discussed, and these studies suggest that charge-writing behavior in LAO-STO includes a strong surface/bulk electrochemical component and is more complicated than simple screening by surface adsorbates.

AB - Local electrochemical phenomena on the surfaces of the LaAlO 3-SrTiO 3 heterostructure are explored using unipolar and bipolar dynamic electrochemical strain microscopy (D-ESM). The D-ESM suggests the presence of at least two distinct electrochemical processes, including fast reversible low-voltage process and slow high-voltage process. The latter process is associated with static surface deformations in the sub-nanometer regime. These behaviors are compared with Kelvin probe force microscopy hysteresis data. The possible origins of observed phenomena are discussed, and these studies suggest that charge-writing behavior in LAO-STO includes a strong surface/bulk electrochemical component and is more complicated than simple screening by surface adsorbates.

KW - Charge writing

KW - Dynamic strain

KW - Electrochemical

KW - Microscopy

UR - http://www.scopus.com/inward/record.url?scp=84864686046&partnerID=8YFLogxK

U2 - 10.1021/nn204960c

DO - 10.1021/nn204960c

M3 - Article

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EP - 3852

JO - ACS Nano

JF - ACS Nano

IS - 5

ER -

Probing surface and bulk electrochemical processes on the LaAlO ₃-SrTiO ₃ interface

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Keywords

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