Probing nanostructures site by site with the aberration-corrected STEM

S. J. Pennycook; A. R. Lupini; M. Varela; A. Borisevich; Y. Peng; R. Buczko; X. Fan; J. R. McBride; T. C. Kippeny; S. J. Rosenthal; A. Franceschetti; S. T. Pantelides

doi:10.1017/s143192760344124x

Probing nanostructures site by site with the aberration-corrected STEM

S. J. Pennycook
, A. R. Lupini
, M. Varela
, A. Borisevich
, Y. Peng
, R. Buczko
, X. Fan
, J. R. McBride
, T. C. Kippeny
, S. J. Rosenthal
, A. Franceschetti
, S. T. Pantelides

electron Microscopy and Microanalysis

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Original language	English
Pages (from-to)	2-3
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	9
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/s143192760344124x
State	Published - 2003

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10.1017/s143192760344124x

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@article{2182ad3b2b4746829cf1360ac7195eaa,

title = "Probing nanostructures site by site with the aberration-corrected STEM",

author = "Pennycook, \{S. J.\} and Lupini, \{A. R.\} and M. Varela and A. Borisevich and Y. Peng and R. Buczko and X. Fan and McBride, \{J. R.\} and Kippeny, \{T. C.\} and Rosenthal, \{S. J.\} and A. Franceschetti and Pantelides, \{S. T.\}",

year = "2003",

doi = "10.1017/s143192760344124x",

language = "English",

volume = "9",

pages = "2--3",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - Probing nanostructures site by site with the aberration-corrected STEM

AU - Pennycook, S. J.

AU - Lupini, A. R.

AU - Varela, M.

AU - Borisevich, A.

AU - Peng, Y.

AU - Buczko, R.

AU - Fan, X.

AU - McBride, J. R.

AU - Kippeny, T. C.

AU - Rosenthal, S. J.

AU - Franceschetti, A.

AU - Pantelides, S. T.

PY - 2003

Y1 - 2003

UR - https://www.scopus.com/pages/publications/0041923780

U2 - 10.1017/s143192760344124x

DO - 10.1017/s143192760344124x

M3 - Article

AN - SCOPUS:0041923780

SN - 1431-9276

VL - 9

SP - 2

EP - 3

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Probing nanostructures site by site with the aberration-corrected STEM

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