Original language | English |
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Pages (from-to) | 2-3 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 9 |
Issue number | SUPPL. 2 |
DOIs | |
State | Published - 2003 |
Probing nanostructures site by site with the aberration-corrected STEM
S. J. Pennycook, A. R. Lupini, M. Varela, A. Borisevich, Y. Peng, R. Buczko, X. Fan, J. R. McBride, T. C. Kippeny, S. J. Rosenthal, A. Franceschetti, S. T. Pantelides
Research output: Contribution to journal › Article › peer-review
2
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citations