Probing local ionic dynamics in functional oxides at the nanoscale

Evgheni Strelcov; Yunseok Kim; Stephen Jesse; Ye Cao; Ilia N. Ivanov; Ivan I. Kravchenko; Chih Hung Wang; Yung Chun Teng; Long Qing Chen; Ying Hao Chu; Sergei V. Kalinin

doi:10.1021/nl400780d

Probing local ionic dynamics in functional oxides at the nanoscale

Evgheni Strelcov, Yunseok Kim, Stephen Jesse, Ye Cao, Ilia N. Ivanov, Ivan I. Kravchenko, Chih Hung Wang, Yung Chun Teng, Long Qing Chen, Ying Hao Chu, Sergei V. Kalinin

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55 Scopus citations

Abstract

A scanning probe microscopy technique for probing local ionic dynamics in electrochemically active materials based on the first-order reversal curve current-voltage (FORC-IV) method is presented. FORC-IV imaging mode is applied to a Ca-substituted bismuth ferrite (Ca-BFO) system to separate the electronic and ionic phenomena in this material and visualize the spatial variability of these behaviors. The variable-temperature measurements further demonstrate the interplay between the thermally and electric-field-driven resistance changes in Ca-BFO. The FORC-IV is shown to be a simple, powerful, and flexible method for studying electrochemical activity of materials at the nanoscale and, in conjunction with the electrochemical strain microscopy, it can be used for differentiating ferroelectric and ionic behaviors.

Original language	English
Pages (from-to)	3455-3462
Number of pages	8
Journal	Nano Letters
Volume	13
Issue number	8
DOIs	https://doi.org/10.1021/nl400780d
State	Published - Aug 14 2013

Keywords

Ca-BFO
FORC-IV
SPM
ionic dynamics
oxygen vacancy
voltage spectroscopy

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10.1021/nl400780d

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@article{e2d5ed350485475080d743bc73c6e6f5,

title = "Probing local ionic dynamics in functional oxides at the nanoscale",

abstract = "A scanning probe microscopy technique for probing local ionic dynamics in electrochemically active materials based on the first-order reversal curve current-voltage (FORC-IV) method is presented. FORC-IV imaging mode is applied to a Ca-substituted bismuth ferrite (Ca-BFO) system to separate the electronic and ionic phenomena in this material and visualize the spatial variability of these behaviors. The variable-temperature measurements further demonstrate the interplay between the thermally and electric-field-driven resistance changes in Ca-BFO. The FORC-IV is shown to be a simple, powerful, and flexible method for studying electrochemical activity of materials at the nanoscale and, in conjunction with the electrochemical strain microscopy, it can be used for differentiating ferroelectric and ionic behaviors.",

keywords = "Ca-BFO, FORC-IV, SPM, ionic dynamics, oxygen vacancy, voltage spectroscopy",

author = "Evgheni Strelcov and Yunseok Kim and Stephen Jesse and Ye Cao and Ivanov, \{Ilia N.\} and Kravchenko, \{Ivan I.\} and Wang, \{Chih Hung\} and Teng, \{Yung Chun\} and Chen, \{Long Qing\} and Chu, \{Ying Hao\} and Kalinin, \{Sergei V.\}",

year = "2013",

month = aug,

day = "14",

doi = "10.1021/nl400780d",

language = "English",

volume = "13",

pages = "3455--3462",

journal = "Nano Letters",

issn = "1530-6984",

publisher = "American Chemical Society",

number = "8",

}

TY - JOUR

T1 - Probing local ionic dynamics in functional oxides at the nanoscale

AU - Strelcov, Evgheni

AU - Kim, Yunseok

AU - Jesse, Stephen

AU - Cao, Ye

AU - Ivanov, Ilia N.

AU - Kravchenko, Ivan I.

AU - Wang, Chih Hung

AU - Teng, Yung Chun

AU - Chen, Long Qing

AU - Chu, Ying Hao

AU - Kalinin, Sergei V.

PY - 2013/8/14

Y1 - 2013/8/14

N2 - A scanning probe microscopy technique for probing local ionic dynamics in electrochemically active materials based on the first-order reversal curve current-voltage (FORC-IV) method is presented. FORC-IV imaging mode is applied to a Ca-substituted bismuth ferrite (Ca-BFO) system to separate the electronic and ionic phenomena in this material and visualize the spatial variability of these behaviors. The variable-temperature measurements further demonstrate the interplay between the thermally and electric-field-driven resistance changes in Ca-BFO. The FORC-IV is shown to be a simple, powerful, and flexible method for studying electrochemical activity of materials at the nanoscale and, in conjunction with the electrochemical strain microscopy, it can be used for differentiating ferroelectric and ionic behaviors.

AB - A scanning probe microscopy technique for probing local ionic dynamics in electrochemically active materials based on the first-order reversal curve current-voltage (FORC-IV) method is presented. FORC-IV imaging mode is applied to a Ca-substituted bismuth ferrite (Ca-BFO) system to separate the electronic and ionic phenomena in this material and visualize the spatial variability of these behaviors. The variable-temperature measurements further demonstrate the interplay between the thermally and electric-field-driven resistance changes in Ca-BFO. The FORC-IV is shown to be a simple, powerful, and flexible method for studying electrochemical activity of materials at the nanoscale and, in conjunction with the electrochemical strain microscopy, it can be used for differentiating ferroelectric and ionic behaviors.

KW - Ca-BFO

KW - FORC-IV

KW - SPM

KW - ionic dynamics

KW - oxygen vacancy

KW - voltage spectroscopy

UR - https://www.scopus.com/pages/publications/84881606168

U2 - 10.1021/nl400780d

DO - 10.1021/nl400780d

M3 - Article

AN - SCOPUS:84881606168

SN - 1530-6984

VL - 13

SP - 3455

EP - 3462

JO - Nano Letters

JF - Nano Letters

IS - 8

ER -

Probing local ionic dynamics in functional oxides at the nanoscale

Abstract

Keywords

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