Probing Light Atoms at Subnanometer Resolution: Realization of Scanning Transmission Electron Microscope Holography

Fehmi S. Yasin; Tyler R. Harvey; Jordan J. Chess; Jordan S. Pierce; Colin Ophus; Peter Ercius; Benjamin J. McMorran

doi:10.1021/acs.nanolett.8b03166

Probing Light Atoms at Subnanometer Resolution: Realization of Scanning Transmission Electron Microscope Holography

Fehmi S. Yasin, Tyler R. Harvey, Jordan J. Chess, Jordan S. Pierce, Colin Ophus, Peter Ercius, Benjamin J. McMorran

Research output: Contribution to journal › Article › peer-review

20 Scopus citations

Abstract

Atomic resolution imaging of light elements in electron-transparent materials has long been a challenge. Biomolecular materials, for example, are rapidly altered by incident electrons. We demonstrate a scanning transmission electron microscopy (STEM) technique, called STEM holography, capable of efficient structural analysis of beam-sensitive nanomaterials. STEM holography measures the absolute phase and amplitude of electrons passed through a specimen via interference with a vacuum reference wave. We use an amplitude-dividing nanofabricated grating to prepare multiple beams focused at the sample. We configure the postspecimen microscope imaging system to overlap the beams, forming an interference pattern. We record and analyze the pattern at each 2D-raster-scan-position, reconstructing the complex object wave. As a demonstration, we image gold nanoparticles on an amorphous carbon substrate at 2.4 Å resolution. STEM holography offers higher contrast of the carbon while maintaining gold atomic lattice resolution compared to high angle annular dark field STEM.

Original language	English
Pages (from-to)	7118-7123
Number of pages	6
Journal	Nano Letters
Volume	18
Issue number	11
DOIs	https://doi.org/10.1021/acs.nanolett.8b03166
State	Published - Nov 14 2018
Externally published	Yes

Funding

B.J.M., T.R.H., J.J.C. and J.S.P. were partially supported by both the U.S. Department of Energy, Office of Science, Basic Energy Sciences, under Award DE-SC0010466 and the National Science Foundation under Grant No. 1607733. F.S.Y. was supported by the National Science Foundation Graduate Research Fellowship Program under Grant No. 1309047. The imaging was performed on TEAM I at the Molecular Foundry, Lawrence Berkeley National Laboratory, which is supported by the Office of Science, Office of Basic Energy Sciences of the U.S. Department of Energy, under Contract No. DE-AC02-05CH11231.

Funders	Funder number
Office of Basic Energy Sciences	DE-AC02-05CH11231
National Science Foundation	1607733
U.S. Department of Energy
Directorate for Education and Human Resources	1309047
Office of Science
Basic Energy Sciences	DE-SC0010466

Keywords

4D-STEM
Electron holography
STEM
TEM
electron interferometry
nanomaterials imaging

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10.1021/acs.nanolett.8b03166

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title = "Probing Light Atoms at Subnanometer Resolution: Realization of Scanning Transmission Electron Microscope Holography",

abstract = "Atomic resolution imaging of light elements in electron-transparent materials has long been a challenge. Biomolecular materials, for example, are rapidly altered by incident electrons. We demonstrate a scanning transmission electron microscopy (STEM) technique, called STEM holography, capable of efficient structural analysis of beam-sensitive nanomaterials. STEM holography measures the absolute phase and amplitude of electrons passed through a specimen via interference with a vacuum reference wave. We use an amplitude-dividing nanofabricated grating to prepare multiple beams focused at the sample. We configure the postspecimen microscope imaging system to overlap the beams, forming an interference pattern. We record and analyze the pattern at each 2D-raster-scan-position, reconstructing the complex object wave. As a demonstration, we image gold nanoparticles on an amorphous carbon substrate at 2.4 {\AA} resolution. STEM holography offers higher contrast of the carbon while maintaining gold atomic lattice resolution compared to high angle annular dark field STEM.",

keywords = "4D-STEM, Electron holography, STEM, TEM, electron interferometry, nanomaterials imaging",

author = "Yasin, {Fehmi S.} and Harvey, {Tyler R.} and Chess, {Jordan J.} and Pierce, {Jordan S.} and Colin Ophus and Peter Ercius and McMorran, {Benjamin J.}",

note = "Publisher Copyright: {\textcopyright} 2018 American Chemical Society.",

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doi = "10.1021/acs.nanolett.8b03166",

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AU - Chess, Jordan J.

AU - Pierce, Jordan S.

AU - Ophus, Colin

AU - Ercius, Peter

AU - McMorran, Benjamin J.

PY - 2018/11/14

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N2 - Atomic resolution imaging of light elements in electron-transparent materials has long been a challenge. Biomolecular materials, for example, are rapidly altered by incident electrons. We demonstrate a scanning transmission electron microscopy (STEM) technique, called STEM holography, capable of efficient structural analysis of beam-sensitive nanomaterials. STEM holography measures the absolute phase and amplitude of electrons passed through a specimen via interference with a vacuum reference wave. We use an amplitude-dividing nanofabricated grating to prepare multiple beams focused at the sample. We configure the postspecimen microscope imaging system to overlap the beams, forming an interference pattern. We record and analyze the pattern at each 2D-raster-scan-position, reconstructing the complex object wave. As a demonstration, we image gold nanoparticles on an amorphous carbon substrate at 2.4 Å resolution. STEM holography offers higher contrast of the carbon while maintaining gold atomic lattice resolution compared to high angle annular dark field STEM.

AB - Atomic resolution imaging of light elements in electron-transparent materials has long been a challenge. Biomolecular materials, for example, are rapidly altered by incident electrons. We demonstrate a scanning transmission electron microscopy (STEM) technique, called STEM holography, capable of efficient structural analysis of beam-sensitive nanomaterials. STEM holography measures the absolute phase and amplitude of electrons passed through a specimen via interference with a vacuum reference wave. We use an amplitude-dividing nanofabricated grating to prepare multiple beams focused at the sample. We configure the postspecimen microscope imaging system to overlap the beams, forming an interference pattern. We record and analyze the pattern at each 2D-raster-scan-position, reconstructing the complex object wave. As a demonstration, we image gold nanoparticles on an amorphous carbon substrate at 2.4 Å resolution. STEM holography offers higher contrast of the carbon while maintaining gold atomic lattice resolution compared to high angle annular dark field STEM.

KW - 4D-STEM

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KW - STEM

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KW - electron interferometry

KW - nanomaterials imaging

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ER -

Probing Light Atoms at Subnanometer Resolution: Realization of Scanning Transmission Electron Microscope Holography

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