Abstract
Coating/substrate interface and oxide layers present in Inconel 625 film may cause significant impacts on its corrosion behavior. However, layered structure of Inconel 625 coatings remains poorly understood due to its requirement of high spatial resolution. This study applies X-ray reflectometry (XRR) to probe the layered structure of magnetron-sputtered Inconel 625 film with atomic spatial resolution. Our results indicate that there exists a 2 nm thick Cr-rich Inconel sublayer underneath the principal film. On top of the principal film, it is found a 2 nm thick oxide layer mainly consisting of NiO. In addition, we detected ~2 Å contamination layer on the sapphire substrate, although argon ion sputter cleaning had been applied to the substrate prior to deposition. By comparing the coatings with different deposition time, we observed that the thickness of principal Inconel 625 layer grows linearly with deposition time, with all other layers remaining constant. Our findings provide insight into the layered structures of Inconel 625 coatings with atomic-scale spatial resolution, and provide directions for future efforts that aim to improve the corrosion resistance of Inconel 625 coatings.
Original language | English |
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Article number | 126545 |
Journal | Surface and Coatings Technology |
Volume | 405 |
DOIs | |
State | Published - Jan 15 2021 |
Externally published | Yes |
Funding
This material is based upon work supported by the U.S. Department of Energy's Office of Energy Efficiency and Renewable Energy (EERE) under the Generation 3 Concentrated Solar Power (CSP) Systems award number DE-EE0008380. This work was partially supported by Nuclear Regulatory Commission under the contract NRC-HQ-84-15-G-0018. Certain commercial equipment, instruments, or materials (or suppliers, or software, …) are identified in this paper to foster understanding. The identification of any commercial product or trade name does not imply endorsement or recommendation by the National Institute of Standards and Technology, nor does it imply that the materials or equipment identified are necessarily the best available for the purpose. This material is based upon work supported by the U.S. Department of Energy's Office of Energy Efficiency and Renewable Energy (EERE) under the Generation 3 Concentrated Solar Power (CSP) Systems award number DE-EE0008380 . This work was partially supported by Nuclear Regulatory Commission under the contract NRC-HQ-84-15-G-0018 . Certain commercial equipment, instruments, or materials (or suppliers, or software, …) are identified in this paper to foster understanding. The identification of any commercial product or trade name does not imply endorsement or recommendation by the National Institute of Standards and Technology, nor does it imply that the materials or equipment identified are necessarily the best available for the purpose.
Funders | Funder number |
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U.S. Department of Energy | |
National Institute of Standards and Technology | |
U.S. Nuclear Regulatory Commission | NRC-HQ-84-15-G-0018 |
Office of Energy Efficiency and Renewable Energy | DE-EE0008380 |
Keywords
- Coating/substrate interface
- Inconel 625 alloy coating
- Magnetron sputtering
- Oxide layer
- X-ray reflectometry