Probing large area surface plasmon interference in thin metal films using photon scanning tunneling microscopy

A. Passian, A. Wig, A. L. Lereu, P. G. Evans, F. Meriaudeau, T. Thundat, T. L. Ferrell

Research output: Contribution to journalArticlepeer-review

26 Scopus citations

Abstract

The interference of surface plasmons can provide important information regarding the surface features of the hosting thin metal film. We present an investigation of the interference of optically excited surface plasmons in the Kretschmann configuration in the visible spectrum. Large area surface plasmon interference regions are generated at several wavelengths and imaged with the photon scanning tunneling microscope. Furthermore, we discuss the non-retarded dispersion relations for the surface plasmons in the probe-metal system modeled as confocal hyperboloids of revolution in the spheroidal coordinate systems.

Original languageEnglish
Pages (from-to)429-436
Number of pages8
JournalUltramicroscopy
Volume100
Issue number3-4
DOIs
StatePublished - Aug 2004

Funding

This work was supported by the DOE Office of Biological and Environmental Research (OBER). Oak Ridge National Laboratory, Oak Ridge, Tennessee, 37831-6123, is managed by UT-Battelle, LLC for the Department of Energy under contract number DE-AC05-0096OR22725.

FundersFunder number
DOE Office of Biological and Environmental Research
OBER37831-6123
U.S. Department of EnergyDE-AC05-0096OR22725

    Keywords

    • Dispersion relation
    • Interference
    • Metal thin films
    • Scanning probe microscopy
    • Surface plasmons

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