Abstract
In this study we demonstrate a new method for depositing thick reactive multilayer films (RMFs) (thickness > 14 μm) by using Ti interlayer integration and substrate preheating during fabrication. These two adjustments are designed to alleviate internal planar stresses that cause delamination between deposited layers and peeling off the substrate. Decreasing the distance between Ti interlayers helps to eliminate delamination between deposited layers. Through high speed camera measurements, the reaction propagation speed of an RMF sample with preheating is 42% slower than the same RMF that was not preheated, indicating a slower heat release rate. The preliminary experiments on brazing Ti-6Al-4V coated with BAlSi-4 brazing material revealed dendritic structure branching out from the RMF surface into the brazing material. The dendrite structures most likely form because of rapid melting and solidification of the brazing material. However, this rapid melting and solidification cycle does not appear to occur uniformly across the BAlSi-4RMF interface which is linked to its low bonding strength. When the Ti-6Al-4V substrate is heated to 150 °C prior to ignition, the strength increases to 0.47 MPa when the total RMF thickness is 84 μm and 15 MPa of pressure is applied.
Original language | English |
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Title of host publication | Materials; Joint MSEC-NAMRC-Manufacturing USA |
Publisher | American Society of Mechanical Engineers (ASME) |
ISBN (Print) | 9780791851364 |
DOIs | |
State | Published - 2018 |
Event | ASME 2018 13th International Manufacturing Science and Engineering Conference, MSEC 2018 - College Station, United States Duration: Jun 18 2018 → Jun 22 2018 |
Publication series
Name | ASME 2018 13th International Manufacturing Science and Engineering Conference, MSEC 2018 |
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Volume | 2 |
Conference
Conference | ASME 2018 13th International Manufacturing Science and Engineering Conference, MSEC 2018 |
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Country/Territory | United States |
City | College Station |
Period | 06/18/18 → 06/22/18 |
Funding
Some of the research reported in this paper was conducted under a contract with the National Aeronautics and Space Administration (NASA). This project is jointly supported by a subcontract with the Jet Propulsion Laboratory/California Institute of Technology, and a DOE Office of Science User Facility project at the Center for Nanophase Materials, Oak Ridge National Laboratory. We also acknowledge John Dunlap, Maulik Patel, and the Joint Institute of Advanced Materials for use of their electron microscopy, EDX, and X-ray diffraction equipment and the training they provide.