Original language | English |
---|---|
Pages (from-to) | 1030-1031 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 14 |
Issue number | SUPPL. 2 |
DOIs | |
State | Published - Aug 2008 |
Externally published | Yes |
Preparation of AlGaN-based high electron mobility transistor devices using focused ion beam milling
D. A. Cullen, D. J. Smith
Research output: Contribution to journal › Article › peer-review
1
Scopus
citations