Predictive numerical modeling of plasma-induced surface roughness and wettability evolution in LM-PAEK/CF tape

  • Georges Chahine
  • , Abdallah Barakat
  • , Menisha S. Karunarathna
  • , Yalcin Meraki
  • , Merlin Theodore
  • , Uday Vaidya

Research output: Contribution to journalArticlepeer-review

Abstract

Plasma surface modification effectively enhances adhesion in thermoplastic composites, yet its impacts on high-performance polymers like low-melting polyaryletherketone (LM-PAEK) remain inadequately quantified. This study integrates experimental analysis and numerical modeling to characterize surface roughness and wettability changes in LM-PAEK/carbon fiber composites treated with atmospheric plasma. Atomic Force Microscopy quantified surface topography (n = 10 per condition for contact angles), while static contact-angle assessments measured wettability. Roughness rapidly increased from ∼0.2 nm to 1.6 nm, and contact angle reduced from ∼90° to 24°, both stabilizing after 25–30 s of exposure. A semi-empirical, physics-informed framework was calibrated to these data, coupling surface chemistry via the Owens–Wendt decomposition with topography via the Wenzel roughness factor, and evaluated using out-of-sample (cross-validated) tests, while static contact angle assessments measured wettability. Numerical predictions matched experimental results closely (RMSE <5%, R2> 0.95). Incorporating material-specific parameters, the calibrated model supports plasma-treatment optimization and provides quantitative guidance for improving interfacial adhesion in thermoplastic composite manufacturing.

Original languageEnglish
Article number00219983251392698
JournalJournal of Composite Materials
DOIs
StateAccepted/In press - 2025

Funding

Authors wish to thank Institute of Advanced Composites Manufacturing Innovation (IACMI) (DE-EE0006926) for granting access to the ATP robot and other assets, Plasmatreat north America for providing the air plasma setup, and National Science Foundation (NSF), Industry-University Cooperative Research Centre (IUCRC) under grant number NSF-2052738 for offering technical assistance and resources.

Keywords

  • atomic force microscopy
  • contact angle
  • numerical models
  • plasma treatments
  • surface modifications

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