| Original language | English |
|---|---|
| Pages (from-to) | 357-358 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 30 |
| Issue number | 2024 |
| DOIs | |
| State | Published - Jul 24 2024 |
| Event | 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States Duration: Jul 28 2024 → Aug 1 2024 |
Funding
Electron microscopy was supported by Center for Nanophase Materials Sciences (CNMS), which is a US Department of Energy, Office of Science User Facility at Oak Ridge National Laboratory. This manuscript has been authored by UT-Battelle, LLC, under contract DE-AC05-00OR22725 with the US Department of Energy (DOE). The US government retains and the publisher, by accepting the article for publication, acknowledges that the US government retains a nonexclusive, paid-up, irrevocable, worldwide license to publish or reproduce the published form of this manuscript, or allow others to do so, for US government purposes. DOE will provide public access to these results of federally sponsored research in accordance with the DOE Public Access Plan (http://energy.gov/downloads/doe-public-access-plan).