Precision Defect Engineering in 2D Materials via Automated STEM Atomic Fabrication

Matthew G. Boebinger; Kevin M. Roccapriore; Ayana Ghosh; Kai Xiao; Andrew R. Lupini; Maxim Ziatdinov; Sergei V. Kalinin; Raymond R. Unocic

doi:10.1093/mam/ozae044.163

Precision Defect Engineering in 2D Materials via Automated STEM Atomic Fabrication

Matthew G. Boebinger, Kevin M. Roccapriore, Ayana Ghosh, Kai Xiao, Andrew R. Lupini, Maxim Ziatdinov, Sergei V. Kalinin, Raymond R. Unocic

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	357-358
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	30
Issue number	2024
DOIs	https://doi.org/10.1093/mam/ozae044.163
State	Published - Jul 24 2024
Event	82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States Duration: Jul 28 2024 → Aug 1 2024

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10.1093/mam/ozae044.163

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title = "Precision Defect Engineering in 2D Materials via Automated STEM Atomic Fabrication",

author = "Boebinger, {Matthew G.} and Roccapriore, {Kevin M.} and Ayana Ghosh and Kai Xiao and Lupini, {Andrew R.} and Maxim Ziatdinov and Kalinin, {Sergei V.} and Unocic, {Raymond R.}",

year = "2024",

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doi = "10.1093/mam/ozae044.163",

language = "English",

volume = "30",

pages = "357--358",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "2024",

note = "82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 ; Conference date: 28-07-2024 Through 01-08-2024",

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TY - JOUR

T1 - Precision Defect Engineering in 2D Materials via Automated STEM Atomic Fabrication

AU - Boebinger, Matthew G.

AU - Roccapriore, Kevin M.

AU - Ghosh, Ayana

AU - Xiao, Kai

AU - Lupini, Andrew R.

AU - Ziatdinov, Maxim

AU - Kalinin, Sergei V.

AU - Unocic, Raymond R.

PY - 2024/7/24

Y1 - 2024/7/24

UR - http://www.scopus.com/inward/record.url?scp=85215706833&partnerID=8YFLogxK

U2 - 10.1093/mam/ozae044.163

DO - 10.1093/mam/ozae044.163

M3 - Conference article

AN - SCOPUS:85215706833

SN - 1431-9276

VL - 30

SP - 357

EP - 358

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 2024

T2 - 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024

Y2 - 28 July 2024 through 1 August 2024

ER -

Precision Defect Engineering in 2D Materials via Automated STEM Atomic Fabrication

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