Power scaling and beam divergence compression of bottom-emitting vertical-cavity surface-emitting lasers

Xing Zhang, Yongqiang Ning, Jianwei Zhang, Jinsheng Zhang, Peng Jia, Xiushan Li, Jingjing Shi, Li Qin, Yun Liu, Cunzhu Tong, Lijun Wang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Power scaling and beam divergence compression of 980 nm bottom-emitting vertical-cavity surface-emitting lasers (VCSELs) are presented in this paper. First, the relationships among the reflectivity of the n-doped distributed Bragg reflector, threshold current, and output power were analyzed, and the n-DBR reflectivity was optimized to achieve higher slope efficiency in a relatively low threshold current. Second, the influence of the p-contact on the current density distribution inside the active region was analyzed using the three-dimensional finite-element method. Uniform current distribution was achieved by optimizing the diameter of the p-contact, and a consequent improvement in beam divergence was observed. A low divergence of 5.4° was obtained for a single device with continuous-wave (CW) of 1.46 W at room temperature. The 8×8 VCSEL array showed a divergence angle of 10.2° at 4A. This array afforded a CW output power of 1.95 W under an injected current of 4 A and a pulse output power of 115 W under a pulse drive current of 130 A, a pulse width of 100 ns, and a repetition frequency of 100 Hz. VCSEL array chips were packaged in series to form a 'quasi-array to further increase the output power. This series achieved a peak output power of 475 W under a pulse drive current of 120 A.

Original languageEnglish
Title of host publicationInternational Symposium on Photoelectronic Detection and Imaging 2013
Subtitle of host publicationHigh Power Lasers and Applications
DOIs
StatePublished - 2013
Externally publishedYes
Event5th International Symposium on Photoelectronic Detection and Imaging, ISPDI 2013 - Beijing, China
Duration: Jun 25 2013Jun 27 2013

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8904
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference5th International Symposium on Photoelectronic Detection and Imaging, ISPDI 2013
Country/TerritoryChina
CityBeijing
Period06/25/1306/27/13

Keywords

  • Beam divergence
  • Current density distribution
  • DBR reflectivity optimization
  • Power scaling
  • Vertical-cavity surface-emitting lasers

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