Power cycle testing of power switches: A literature survey

Lakshmi Reddy GopiReddy; Leon M. Tolbert; Burak Ozpineci

doi:10.1109/TPEL.2014.2359015

Power cycle testing of power switches: A literature survey

Lakshmi Reddy GopiReddy, Leon M. Tolbert, Burak Ozpineci

Buildings and Transportation Science Div

Research output: Contribution to journal › Article › peer-review

190 Scopus citations

Abstract

Reliability of power converters and lifetime prediction has been a major topic of research in the last few decades, especially for traction applications. The main failures in high power semiconductors are caused by thermomechanical fatigue. Power cycling and temperature cycling are the two most common thermal acceleration tests used in assessing reliability. The objective of this paper is to study the various power cycling tests found in the literature and to develop generalized steps in planning application specific power cycling tests. A comparison of different tests based on the failures, duration, test circuits, and monitored electrical parameters is presented.

Original language	English
Article number	6902808
Pages (from-to)	2465-2473
Number of pages	9
Journal	IEEE Transactions on Power Electronics
Volume	30
Issue number	5
DOIs	https://doi.org/10.1109/TPEL.2014.2359015
State	Published - May 1 2015

Keywords

Failure mechanisms
lifetime estimation
physics of failure
power cycling
precursor indicators
semiconductor reliability

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Power cycle testing of power switches: A literature survey

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Keywords

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