Abstract
In colliders such as RHIC, the radiation levels are well below those of colliders such as LHC. If the radiation that is present affects the entire analog memory unit (AMU) in a uniform fashion, then a real-time correction should be able to be performed to correct any changes seen in the memory as well as the induced correlated noise from detector pickup, thus precluding the need for a more expensive rad-hard process. This paper will present testing on memories fabricated in a 'soft' process and exposed to ionizing radiation. We used a single pipeline as a reference to be subtracted on a cell-by-cell basis from each pipe during read out and investigated the spatial effects of using different pipes for the reference. Use of this method reduced the noise which was common to all pipes (common-mode noise) and thus reduced both common-mode input noise and pattern noise generated from address lines being exercised on the AMU.
Original language | English |
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Pages (from-to) | 1564-1569 |
Number of pages | 6 |
Journal | IEEE Transactions on Nuclear Science |
Volume | 43 |
Issue number | 3 PART 2 |
DOIs | |
State | Published - 1996 |
Funding
'Research sponsored by the U.S. Department of Energy and performed at Oak Ridge National Laboratory, managed by Lockheed Martin Energy Systems for the U.S. Department of Energy under Contract No. DE-AC05-840R2 1400.
Funders | Funder number |
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U.S. Department of Energy | |
Lockheed Martin | |
Oak Ridge National Laboratory |