Abstract
This paper presents testing on memories fabricated in a 'soft' process and exposed to ionizing radiation. A single pipeline is used as a reference to be subtracted in a cell-by-cell basis from each pipe during read out and the spatial effects of using different pipes for the reference are investigated. Use of this method reduced the noise which was common to all pipes (common-mode noise) and thus reduced both common-mode input noise and pattern noise generated from address lines being exercised on the AMU. The correlation across the memories vs. radiation dose was found to be on the order of 10 bits. Both pre-and post-radiation results are presented on systems designed for PHENIX and WA98 at CERN as well as measured results on the minimization of the effects of injected systematic noise.
Original language | English |
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Pages | 622-626 |
Number of pages | 5 |
State | Published - 1995 |
Event | Proceedings of the 1995 IEEE Nuclear Science Symposium and Medical Imaging Conference. Part 1 (of 3) - San Francisco, CA, USA Duration: Oct 21 1995 → Oct 28 1995 |
Conference
Conference | Proceedings of the 1995 IEEE Nuclear Science Symposium and Medical Imaging Conference. Part 1 (of 3) |
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City | San Francisco, CA, USA |
Period | 10/21/95 → 10/28/95 |