Post-radiation memory correction using differential subtraction for PHENIX

C. L. Britton, A. L. Wintenberg, G. R. Young, T. C. Awes, M. Womac, E. J. Kennedy, R. S. Smith

Research output: Contribution to conferencePaperpeer-review

Abstract

This paper presents testing on memories fabricated in a 'soft' process and exposed to ionizing radiation. A single pipeline is used as a reference to be subtracted in a cell-by-cell basis from each pipe during read out and the spatial effects of using different pipes for the reference are investigated. Use of this method reduced the noise which was common to all pipes (common-mode noise) and thus reduced both common-mode input noise and pattern noise generated from address lines being exercised on the AMU. The correlation across the memories vs. radiation dose was found to be on the order of 10 bits. Both pre-and post-radiation results are presented on systems designed for PHENIX and WA98 at CERN as well as measured results on the minimization of the effects of injected systematic noise.

Original languageEnglish
Pages622-626
Number of pages5
StatePublished - 1995
EventProceedings of the 1995 IEEE Nuclear Science Symposium and Medical Imaging Conference. Part 1 (of 3) - San Francisco, CA, USA
Duration: Oct 21 1995Oct 28 1995

Conference

ConferenceProceedings of the 1995 IEEE Nuclear Science Symposium and Medical Imaging Conference. Part 1 (of 3)
CitySan Francisco, CA, USA
Period10/21/9510/28/95

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