Polytypism in few-layer gallium selenide

Soo Yeon Lim, Jae Ung Lee, Jung Hwa Kim, Liangbo Liang, Xiangru Kong, Thi Thanh Huong Nguyen, Zonghoon Lee, Sunglae Cho, Hyeonsik Cheong

Research output: Contribution to journalArticlepeer-review

29 Scopus citations

Abstract

Gallium selenide (GaSe) is one of the layered group-III metal monochalcogenides, which has an indirect bandgap in the monolayer and a direct bandgap in bulk unlike other conventional transition metal dichalcogenides (TMDs) such as MoX2 and WX2 (X = S and Se). Four polytypes of bulk GaSe, designated as β-, ϵ-, γ-, and δ-GaSe, have been reported. Since different polytypes result in different optical and electrical properties even with the same thickness, identifying the polytype is essential in utilizing this material for various optoelectronic applications. We performed polarized Raman measurements on GaSe and found different ultra-low-frequency Raman spectra of inter-layer vibrational modes even with the same thickness due to different stacking sequences of the polytypes. By comparing the ultra-low-frequency Raman spectra with the theoretical calculations and high-resolution electron microscopy measurements, we established the correlation between the ultra-low-frequency Raman spectra and the stacking sequences of trilayer GaSe. We further found that the AB-type stacking is more stable than the AA′-type stacking in GaSe.

Original languageEnglish
Pages (from-to)8563-8573
Number of pages11
JournalNanoscale
Volume12
Issue number15
DOIs
StatePublished - Apr 21 2020

Bibliographical note

Publisher Copyright:
© 2020 The Royal Society of Chemistry.

Funding

This work was supported by the National Research Foundation (NRF) grant funded by the Korean government (MSIT) (NRF-2014R1A4A1071686, 2018R1A2A2A05019598, 2019R1A2C3006189, 2019R1F1A1058473, and no. 2017R1A5A1014862, SRC program: vdWMRC center), by a grant IBS-R019-D1, and by a grant (no. 2013M3A6A5073173) from the Center for Advanced Soft Electronics under the Global Frontier Research Program of MSIT. A portion of this research (Raman scattering modeling) used resources available at the Center for Nanophase Materials Sciences, which is a US Department of Energy Office of Science User Facility. L. L. and X. K. acknowledge the work conducted at the Center for Nanophase Materials Sciences. S. Y. L. acknowledges support from the Hyundai Motor Chung Mong-Koo Foundation.

FundersFunder number
Center for Advanced Soft Electronics
Hyundai Motor Chung Mong-Koo Foundation
National Research Foundation
Ministry of Science and ICT, South Korea2013M3A6A5073173, 2017R1A5A1014862, 2019R1F1A1058473, 2019R1A2C3006189, NRF-2014R1A4A1071686, 2018R1A2A2A05019598, IBS-R019-D1

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