Abstract
Crystalline micrometer-long YSi2 nanowires with cross sections as small as 1 × 0.5 nm2 can be grown on the Si(001) surface. Their extreme aspect ratios make electron conduction within these nanowires almost ideally one-dimensional, while their compatibility with the silicon platform suggests application as metallic interconnect in Si-based nanoelectronic devices. Here we combine bottom-up epitaxial wire synthesis in ultrahigh vacuum with top-down miniaturization of the electrical measurement probes to elucidate the electronic conduction mechanism of both individual wires and arrays of nanowires. Temperature-dependent transport through individual nanowires is indicative of thermally assisted tunneling of small polarons between atomic-scale defect centers. In-depth analysis of complex wire networks emphasize significant electronic crosstalk between the nanowires due to the long-range Coulomb fields associated with polaronic charge fluctuations. This work establishes a semiquantitative correlation between the density and distributions of atomic-scale defects and resulting current-voltage characteristics of nanoscale network devices.
Original language | English |
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Pages (from-to) | 3684-3689 |
Number of pages | 6 |
Journal | Nano Letters |
Volume | 13 |
Issue number | 8 |
DOIs | |
State | Published - Aug 14 2013 |
Keywords
- one-dimensional conductance
- polarons
- scanning tunneling microscopy
- self-assembly
- silicide nanowires