Abstract
By exciting diffraction in the Laue geometry by specularly reflected beams, penetrating x-rays and neutrons can be used to probe surface and interfacial atomic structure. We present the first such measurement utilizing polarized neutrons with both incident- and exit-angle resolution. We have observed the evolution of magnetic order by monitoring the in-plane (101̄0) Bragg peak from an epitaxially grown film consisting of 150 angstrom Y(0001) on 5000 angstrom Gd(0001). Magnetic scattering increases as the film is cooled from the Gd bulk Curie temperature (293 K) to 100 K. The gross features of the data can be captured by a simple two-layer model, but sufficient disagreement remains that one may yet hope to extract non-trivial structure at the Y/Gd interface.
Original language | English |
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Pages (from-to) | 573-576 |
Number of pages | 4 |
Journal | Materials Research Society Symposium - Proceedings |
Volume | 376 |
State | Published - 1995 |
Externally published | Yes |
Event | Proceedings of the 1994 MRS Fall Meeting - Boston, MA, USA Duration: Nov 28 1994 → Nov 30 1994 |