Plug-and-Play with 2.5D Artifact Reduction Prior for Fast and Accurate Industrial Computed Tomography Reconstruction

Research output: Contribution to journalArticlepeer-review

Abstract

Cone-beam X-ray computed tomography (XCT) is an essential imaging technique for generating 3D reconstructions of internal structures, with applications ranging from medical to industrial imaging. Producing high-quality reconstructions typically requires many X-ray measurements; this process can be slow and expensive, especially for dense materials. Recent work incorporating artifact reduction priors within a plug-and-play (PnP) reconstruction framework has shown promising results in improving image quality from sparse-view XCT scans while enhancing the generalizability of deep learning-based solutions. However, this method uses a 2D convolutional neural network (CNN) for artifact reduction, which captures only slice-independent information from the 3D reconstruction, limiting performance. In this paper, we propose a PnP reconstruction method that uses a 2.5D artifact reduction CNN as the prior. This approach leverages inter-slice information from adjacent slices, capturing richer spatial context while remaining computationally efficient. We show that this 2.5D prior not only improves the quality of reconstructions but also enables the model to directly suppress commonly occurring XCT artifacts (such as beam hardening), eliminating the need for artifact correction pre-processing. Experiments on both experimental and synthetic cone-beam XCT data demonstrate that the proposed method better preserves fine structural details, such as pore size and shape, leading to more accurate defect detection compared to 2D priors. In particular, we demonstrate strong performance on experimental XCT data using a 2.5D artifact reduction prior trained entirely on simulated scans, highlighting the proposed method’s ability to generalize across domains.

Original languageEnglish
Article number147
JournalJournal of Nondestructive Evaluation
Volume44
Issue number4
DOIs
StatePublished - Dec 2025

Funding

The manuscript has been authored by UT-Battelle, LLC, under contract DE-AC05-00OR22725 with the US Department of Energy (DOE). Research sponsored by Artificial Intelligence (AI) Initiative under Laboratory Directed Research & Development (LDRD) at Oak Ridge National Lab (ORNL). The US government retains and the publisher, by accepting the article for publication, acknowledges that the US government retains a nonexclusive, paid-up, irrevocable, worldwide license to publish or reproduce the published form of this manuscript, or allow others to do so, for US government purposes. DOE will provide public access to these results of federally sponsored research in accordance with the DOE Public Access Plan ( http://energy.gov/downloads/doe-public-access-plan ).

Keywords

  • Super-resolution
  • X-ray CT
  • deep-neural network

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