PixFEL: Development of an X-ray diffraction imager for future FEL applications

Luca Lodola; G. Batignani; M. A. Benkechkache; S. Bettarini; G. Casarosa; G. F. Dalla Betta; L. Fabris; F. Forti; M. Giorgi; M. Grassi; P. Malcovati; M. Manghisoni; F. Morsani; A. Paladino; L. Pancheri; E. Paoloni; L. Ratti; V. Re; G. Rizzo; G. Traversi; C. Vacchi; G. Verzellesi; H. Xu

PixFEL: Development of an X-ray diffraction imager for future FEL applications

Luca Lodola, G. Batignani, M. A. Benkechkache, S. Bettarini, G. Casarosa, G. F. Dalla Betta, L. Fabris, F. Forti, M. Giorgi, M. Grassi, P. Malcovati, M. Manghisoni, F. Morsani, A. Paladino, L. Pancheri, E. Paoloni, L. Ratti, V. Re, G. Rizzo, G. TraversiC. Vacchi, G. Verzellesi, H. Xu

Radiation Imaging and Advanced Diagnosti

Research output: Contribution to journal › Conference article › peer-review

Abstract

A readout chip for diffraction imaging applications at new generation X-ray FELs (Free Electron Lasers) has been designed in a 65 nm CMOS technology. It consists of a 32 × 32 matrix, with square pixels and a pixel pitch of 110 μm. Each cell includes a low-noise charge sensitive amplifier (CSA) with dynamic signal compression, covering an input dynamic range from 1 to 10⁴ photons and featuring single photon resolution at small signals at energies from 1 to 10 keV. The CSA output is processed by a time-variant shaper performing gated integration and correlated double sampling. Each pixel includes also a small area, low power 10-bit time-interleaved Successive Approximation Register (SAR) ADC for in-pixel digitization of the amplitude measurement. The channel can be operated at rates up to 4.5 MHz, to be compliant with the rates foreseen for future X-ray FEL machines. The ASIC has been designed in order to be bump bonded to a slim/active edge pixel sensor, in order to build the first demonstrator for the PixFEL (advanced X-ray PIXel cameras at FELs) imager.

Original language	English
Journal	Proceedings of Science
Volume	287
State	Published - 2016
Event	25th International Workshop on Vertex Detectors, Vertex 2016 - La Biodola, Isola d'Elba, Italy Duration: Sep 26 2016 → Sep 30 2016

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Lodola, L., Batignani, G., Benkechkache, M. A., Bettarini, S., Casarosa, G., Dalla Betta, G. F., Fabris, L., Forti, F., Giorgi, M., Grassi, M., Malcovati, P., Manghisoni, M., Morsani, F., Paladino, A., Pancheri, L., Paoloni, E., Ratti, L., Re, V., Rizzo, G., ... Xu, H. (2016). PixFEL: Development of an X-ray diffraction imager for future FEL applications. Proceedings of Science, 287.

@article{1904b498771a48f8905265cbded1e6cc,

title = "PixFEL: Development of an X-ray diffraction imager for future FEL applications",

abstract = "A readout chip for diffraction imaging applications at new generation X-ray FELs (Free Electron Lasers) has been designed in a 65 nm CMOS technology. It consists of a 32 × 32 matrix, with square pixels and a pixel pitch of 110 μm. Each cell includes a low-noise charge sensitive amplifier (CSA) with dynamic signal compression, covering an input dynamic range from 1 to 104 photons and featuring single photon resolution at small signals at energies from 1 to 10 keV. The CSA output is processed by a time-variant shaper performing gated integration and correlated double sampling. Each pixel includes also a small area, low power 10-bit time-interleaved Successive Approximation Register (SAR) ADC for in-pixel digitization of the amplitude measurement. The channel can be operated at rates up to 4.5 MHz, to be compliant with the rates foreseen for future X-ray FEL machines. The ASIC has been designed in order to be bump bonded to a slim/active edge pixel sensor, in order to build the first demonstrator for the PixFEL (advanced X-ray PIXel cameras at FELs) imager.",

author = "Luca Lodola and G. Batignani and Benkechkache, {M. A.} and S. Bettarini and G. Casarosa and {Dalla Betta}, {G. F.} and L. Fabris and F. Forti and M. Giorgi and M. Grassi and P. Malcovati and M. Manghisoni and F. Morsani and A. Paladino and L. Pancheri and E. Paoloni and L. Ratti and V. Re and G. Rizzo and G. Traversi and C. Vacchi and G. Verzellesi and H. Xu",

note = "Publisher Copyright: {\textcopyright} 2016 Sissa Medialab Srl. All rights reserved.; 25th International Workshop on Vertex Detectors, Vertex 2016 ; Conference date: 26-09-2016 Through 30-09-2016",

year = "2016",

language = "English",

volume = "287",

journal = "Proceedings of Science",

issn = "1824-8039",

publisher = "Sissa Medialab",

}

Lodola, L, Batignani, G, Benkechkache, MA, Bettarini, S, Casarosa, G, Dalla Betta, GF, Fabris, L, Forti, F, Giorgi, M, Grassi, M, Malcovati, P, Manghisoni, M, Morsani, F, Paladino, A, Pancheri, L, Paoloni, E, Ratti, L, Re, V, Rizzo, G, Traversi, G, Vacchi, C, Verzellesi, G & Xu, H 2016, 'PixFEL: Development of an X-ray diffraction imager for future FEL applications', Proceedings of Science, vol. 287.

TY - JOUR

T1 - PixFEL

T2 - 25th International Workshop on Vertex Detectors, Vertex 2016

AU - Lodola, Luca

AU - Batignani, G.

AU - Benkechkache, M. A.

AU - Bettarini, S.

AU - Casarosa, G.

AU - Dalla Betta, G. F.

AU - Fabris, L.

AU - Forti, F.

AU - Giorgi, M.

AU - Grassi, M.

AU - Malcovati, P.

AU - Manghisoni, M.

AU - Morsani, F.

AU - Paladino, A.

AU - Pancheri, L.

AU - Paoloni, E.

AU - Ratti, L.

AU - Re, V.

AU - Rizzo, G.

AU - Traversi, G.

AU - Vacchi, C.

AU - Verzellesi, G.

AU - Xu, H.

PY - 2016

Y1 - 2016

N2 - A readout chip for diffraction imaging applications at new generation X-ray FELs (Free Electron Lasers) has been designed in a 65 nm CMOS technology. It consists of a 32 × 32 matrix, with square pixels and a pixel pitch of 110 μm. Each cell includes a low-noise charge sensitive amplifier (CSA) with dynamic signal compression, covering an input dynamic range from 1 to 104 photons and featuring single photon resolution at small signals at energies from 1 to 10 keV. The CSA output is processed by a time-variant shaper performing gated integration and correlated double sampling. Each pixel includes also a small area, low power 10-bit time-interleaved Successive Approximation Register (SAR) ADC for in-pixel digitization of the amplitude measurement. The channel can be operated at rates up to 4.5 MHz, to be compliant with the rates foreseen for future X-ray FEL machines. The ASIC has been designed in order to be bump bonded to a slim/active edge pixel sensor, in order to build the first demonstrator for the PixFEL (advanced X-ray PIXel cameras at FELs) imager.

AB - A readout chip for diffraction imaging applications at new generation X-ray FELs (Free Electron Lasers) has been designed in a 65 nm CMOS technology. It consists of a 32 × 32 matrix, with square pixels and a pixel pitch of 110 μm. Each cell includes a low-noise charge sensitive amplifier (CSA) with dynamic signal compression, covering an input dynamic range from 1 to 104 photons and featuring single photon resolution at small signals at energies from 1 to 10 keV. The CSA output is processed by a time-variant shaper performing gated integration and correlated double sampling. Each pixel includes also a small area, low power 10-bit time-interleaved Successive Approximation Register (SAR) ADC for in-pixel digitization of the amplitude measurement. The channel can be operated at rates up to 4.5 MHz, to be compliant with the rates foreseen for future X-ray FEL machines. The ASIC has been designed in order to be bump bonded to a slim/active edge pixel sensor, in order to build the first demonstrator for the PixFEL (advanced X-ray PIXel cameras at FELs) imager.

UR - http://www.scopus.com/inward/record.url?scp=85054988480&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:85054988480

SN - 1824-8039

VL - 287

JO - Proceedings of Science

JF - Proceedings of Science

Y2 - 26 September 2016 through 30 September 2016

ER -

PixFEL: Development of an X-ray diffraction imager for future FEL applications

Abstract

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