Pinhole-type two-dimensional ultra-small-angle X-ray scattering on the micrometer scale

Hiroyuki Kishimoto, Yuya Shinohara, Yoshio Suzuki, Akihisa Takeuchi, Naoto Yagi, Yoshiyuki Amemiya

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

A pinhole-type two-dimensional ultra-small-angle X-ray scattering set-up at a so-called medium-length beamline at SPring-8 is reported. A long sample-to-detector distance, 160.5 m, can be used at this beamline and a small-angle resolution of 0.25 μm-1 was thereby achieved at an X-ray energy of 8 keV.

Original languageEnglish
Pages (from-to)1-4
Number of pages4
JournalJournal of Synchrotron Radiation
Volume21
Issue number1
DOIs
StatePublished - Jan 2014
Externally publishedYes

Keywords

  • hierarchical structures
  • nanocomposites
  • ultra-small-angle X-ray scattering

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