Abstract
A pinhole neutron diffraction (PIND) technique was developed to enable improving the spatial resolution down to 250 μm. Instead of the conventional engineering diffraction method which integrates all the diffraction signals on the detector plane, the PIND setup utilizes the diffraction pattern of each pixel on 2D detectors. The proposed PIND arrangement enables improving the spatial resolution of time-of-flight instruments and allows solving problems involving steep gradients of strain or texture. The phase content and preferential orientation of grains inside samples can be spatially resolved in 2D/3D. Further, PIND retains the capability of in-situ non-destructive neutron diffraction mapping of lattice strain and grain orientation under external stimuli such as temperature and force.
Original language | English |
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Article number | 253501 |
Journal | Applied Physics Letters |
Volume | 112 |
Issue number | 25 |
DOIs | |
State | Published - Jun 18 2018 |
Funding
This work was supported by a Laboratory Directed Research and Development Project (LDRD-6789) of ORNL. This research used resources at the Spallation Neutron Source (SNS), Oak Ridge National Laboratory (ORNL), supported by the U.S. Department of Energy, Basic Energy Sciences, Scientific User Facilities Division. We thank Mr. Rick Allen for his engineering support. This manuscript has been authored by UT-Battelle, LLC, under Contract No. DE-AC05-00OR22725 with the U.S. Department of Energy. The United States Government retains and the publisher, by accepting the article for publication, acknowledges that the United States Government retains a non-exclusive, paid-up, irrevocable, worldwide license to publish or reproduce the published form of this manuscript, or allow others to do so, for United States Government purposes. The Department of Energy will provide public access to these results of federally sponsored research in accordance with the DOE Public Access Plan (http://energy.gov/downloads/doe-public-access-plan).