Piezoelectric response enhancement in the proximity of grain boundaries of relaxor-ferroelectric thin films

Steven Brewer; Carmen Deng; Connor Callaway; Sergei V. Kalinin; Rama K. Vasudevan; Nazanin Bassiri-Gharb

doi:10.1063/1.4953575

Piezoelectric response enhancement in the proximity of grain boundaries of relaxor-ferroelectric thin films

Steven Brewer, Carmen Deng, Connor Callaway, Sergei V. Kalinin, Rama K. Vasudevan, Nazanin Bassiri-Gharb

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4 Scopus citations

Abstract

The influence of surface morphology on the local piezoelectric response of highly (100)-textured 0.70PbMg_2/3Nb_1/3O₃-0.30PbTiO₃ thin films is studied using piezoresponse force microscopy in band-excitation mode. The local electromechanical response is mostly suppressed in direct proximity of the grain boundaries. However, within 100-200 nm of the grain boundary, the piezoresponse is substantially enhanced, before decaying again within a region at the center of the grain itself. Nested piezoresponse hysteresis curves confirm the influence of topography descriptors on parameters affecting the hysteresis loop shape. The enhancement of the electromechanical response is rationalized through reduced lateral clamping in the grains with deep trenched boundaries, as well as an expected lower energy for complex domain wall structures, due to curved ferroelectric surfaces. The lower piezoresponse at the center of the grain is assigned to the lateral clamping by the surrounding piezoelectric material.

Original language	English
Article number	242908
Journal	Applied Physics Letters
Volume	108
Issue number	24
DOIs	https://doi.org/10.1063/1.4953575
State	Published - Jun 13 2016

Funding

S.B., C.D., and N.B.G. acknowledge funding from the U.S. National Science Foundation under Grant Nos. DMR-1255379 and CMMI-1537262. C.C. and N.B.G. also acknowledge funding from the Defense Threat Reduction Agency, Basic Research Award No. HDTRA1-15-1-0035, to Georgia Institute of Technology. The research was conducted at the Center for Nanophase Materials Sciences, which also provided support (S.V.K. and R.K.V.) and is a DOE Office of Science User Facility.

Funders	Funder number
DOE Office of Science
U.S. National Science Foundation	CMMI-1537262, DMR-1255379
Defense Threat Reduction Agency	HDTRA1-15-1-0035

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title = "Piezoelectric response enhancement in the proximity of grain boundaries of relaxor-ferroelectric thin films",

abstract = "The influence of surface morphology on the local piezoelectric response of highly (100)-textured 0.70PbMg2/3Nb1/3O3-0.30PbTiO3 thin films is studied using piezoresponse force microscopy in band-excitation mode. The local electromechanical response is mostly suppressed in direct proximity of the grain boundaries. However, within 100-200 nm of the grain boundary, the piezoresponse is substantially enhanced, before decaying again within a region at the center of the grain itself. Nested piezoresponse hysteresis curves confirm the influence of topography descriptors on parameters affecting the hysteresis loop shape. The enhancement of the electromechanical response is rationalized through reduced lateral clamping in the grains with deep trenched boundaries, as well as an expected lower energy for complex domain wall structures, due to curved ferroelectric surfaces. The lower piezoresponse at the center of the grain is assigned to the lateral clamping by the surrounding piezoelectric material.",

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AU - Callaway, Connor

AU - Kalinin, Sergei V.

AU - Vasudevan, Rama K.

AU - Bassiri-Gharb, Nazanin

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N2 - The influence of surface morphology on the local piezoelectric response of highly (100)-textured 0.70PbMg2/3Nb1/3O3-0.30PbTiO3 thin films is studied using piezoresponse force microscopy in band-excitation mode. The local electromechanical response is mostly suppressed in direct proximity of the grain boundaries. However, within 100-200 nm of the grain boundary, the piezoresponse is substantially enhanced, before decaying again within a region at the center of the grain itself. Nested piezoresponse hysteresis curves confirm the influence of topography descriptors on parameters affecting the hysteresis loop shape. The enhancement of the electromechanical response is rationalized through reduced lateral clamping in the grains with deep trenched boundaries, as well as an expected lower energy for complex domain wall structures, due to curved ferroelectric surfaces. The lower piezoresponse at the center of the grain is assigned to the lateral clamping by the surrounding piezoelectric material.

AB - The influence of surface morphology on the local piezoelectric response of highly (100)-textured 0.70PbMg2/3Nb1/3O3-0.30PbTiO3 thin films is studied using piezoresponse force microscopy in band-excitation mode. The local electromechanical response is mostly suppressed in direct proximity of the grain boundaries. However, within 100-200 nm of the grain boundary, the piezoresponse is substantially enhanced, before decaying again within a region at the center of the grain itself. Nested piezoresponse hysteresis curves confirm the influence of topography descriptors on parameters affecting the hysteresis loop shape. The enhancement of the electromechanical response is rationalized through reduced lateral clamping in the grains with deep trenched boundaries, as well as an expected lower energy for complex domain wall structures, due to curved ferroelectric surfaces. The lower piezoresponse at the center of the grain is assigned to the lateral clamping by the surrounding piezoelectric material.

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Piezoelectric response enhancement in the proximity of grain boundaries of relaxor-ferroelectric thin films

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