Piezoelectric force microscopy of crystalline oxide-semiconductor heterostructures

M. S.J. Marshall; D. P. Kumah; J. W. Reiner; A. P. Baddorf; C. H. Ahn; F. J. Walker

doi:10.1063/1.4750243

Piezoelectric force microscopy of crystalline oxide-semiconductor heterostructures

M. S.J. Marshall, D. P. Kumah, J. W. Reiner, A. P. Baddorf, C. H. Ahn, F. J. Walker

Scanning Tunneling Microscopy Group

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

Thin films of epitaxial SrTiO ₃ grown on silicon exhibit compressive in-plane strain that may stabilize ferroelectricity in this normally non-ferroelectric material. We investigate this possibility by using an ultra-high vacuum atomic force microscope to measure the local force response of coherently strained SrTiO ₃ films on silicon to an applied ac electric field. The observed cantilever response is different in regions that were previously written with positive and negative voltages, but the frequency dependence of this response indicates that the dominant forces are related to electrostatic charging rather than ferroelectricity.

Original language	English
Article number	102902
Journal	Applied Physics Letters
Volume	101
Issue number	10
DOIs	https://doi.org/10.1063/1.4750243
State	Published - Sep 3 2012

Funding

The authors acknowledge support from the NSF under Grant Nos. MRSEC DMR 1119826 and DMR 1006256. The authors thank Z. Zhang for beamline support at the Advanced Photon Source (APS). Work at the APS, beamline 33ID, was supported by the DOE Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357. A portion of this research was conducted at the Center for Nanophase Materials Sciences, which is sponsored at Oak Ridge National Laboratory by the Scientific User Facilities Division, U.S. Department of Energy. We acknowledge Peter Maksymovych and Sergei V. Kalinin from the Center for Nanophase Materials Sciences for discussions and assistance with experiments.

Funders	Funder number
DOE Office of Basic Energy Sciences
Scientific User Facilities Division
National Science Foundation	1006256
U.S. Department of Energy
Oak Ridge National Laboratory
American Pain Society

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AU - Ahn, C. H.

AU - Walker, F. J.

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Piezoelectric force microscopy of crystalline oxide-semiconductor heterostructures

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