Piezo control for 1 nm spatial resolution synchrotron X-ray microscopy

K. J. Gofron, K. Lauer, E. Nazaretski, H. Yan, S. Kalbfleisch, A. Greer, B. Dalesio, Y. S. Chu

Research output: Contribution to journalConference articlepeer-review

7 Scopus citations

Abstract

A novel motion control system which utilizes the Power PMAC controller from Delta Tau Data Systems Inc., has been developed for positioning with 1 nm spatial resolution. Present work is a significant step forward towards commissioning of the X-ray microscope which will operate at the Hard X-ray Nanoprobe (HXN) beamline at the NSLS-II. The control system is capable of performing high-speed / high-accuracy on-the-fly scans of the sample with respect to the nano-focusing optics e.g. Multilayer Laue Lenses (MLL) or Fresnel X-ray Zone Plates (ZP) [1]. The Power PMAC controls piezoelectric-based nano-positioning stages using piezo-expansion for short range motion and stick-slip motion for longer travel distances. An EPICS interface to the Power PMAC has been developed allowing for easy integration into a beamline control environment.

Original languageEnglish
Article number012026
JournalJournal of Physics: Conference Series
Volume493
Issue number1
DOIs
StatePublished - 2014
Externally publishedYes
Event17th Pan-American Synchrotron Radiation Instrumentation Conference, SRI 2013 - Gaithersburg, MD, United States
Duration: Jun 19 2013Jun 21 2013

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