Picosecond testing and evaluation of three terminal devices

H. R. Fetterman; M. Matloubian; D. V. Plant; M. Martin; F. Oshita

doi:10.1109/IRSSE.1991.665293

Picosecond testing and evaluation of three terminal devices

H. R. Fetterman
, M. Matloubian
, D. V. Plant
, M. Martin
, F. Oshita

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	1991 Summer Topical Meetings on Spaceborne Photonics
Subtitle of host publication	Aerospace Applications of Lasers and Electro-Optics and Optical Millimeter-Wave Interactions: Measurements, Generation, Transmission and Control
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	11-12
Number of pages	2
ISBN (Electronic)	0879426187
DOIs	https://doi.org/10.1109/IRSSE.1991.665293
State	Published - 1991
Externally published	Yes
Event	1991 Summer Topical Meetings on Spaceborne Photonics: Aerospace Applications of Lasers and Electro-Optics and Optical Millimeter-Wave Interactions: Measurements, Generation, Transmission and Control - Newport Beach, United States Duration: Jul 24 1991 → Jul 26 1991

Publication series

Name	LEOS Summer Topical Meeting
Volume	1991-July
ISSN (Print)	1099-4742

Conference

Conference	1991 Summer Topical Meetings on Spaceborne Photonics: Aerospace Applications of Lasers and Electro-Optics and Optical Millimeter-Wave Interactions: Measurements, Generation, Transmission and Control
Country/Territory	United States
City	Newport Beach
Period	07/24/91 → 07/26/91

Access to Document

10.1109/IRSSE.1991.665293

Cite this

Fetterman, H. R., Matloubian, M., Plant, D. V., Martin, M., & Oshita, F. (1991). Picosecond testing and evaluation of three terminal devices. In 1991 Summer Topical Meetings on Spaceborne Photonics: Aerospace Applications of Lasers and Electro-Optics and Optical Millimeter-Wave Interactions: Measurements, Generation, Transmission and Control (pp. 11-12). Article 665293 (LEOS Summer Topical Meeting; Vol. 1991-July). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IRSSE.1991.665293

Fetterman, H. R. ; Matloubian, M. ; Plant, D. V. et al. / Picosecond testing and evaluation of three terminal devices. 1991 Summer Topical Meetings on Spaceborne Photonics: Aerospace Applications of Lasers and Electro-Optics and Optical Millimeter-Wave Interactions: Measurements, Generation, Transmission and Control. Institute of Electrical and Electronics Engineers Inc., 1991. pp. 11-12 (LEOS Summer Topical Meeting).

@inproceedings{11cc0d879d4a436fa57cb5fbc3ec3d1e,

title = "Picosecond testing and evaluation of three terminal devices",

author = "Fetterman, \{H. R.\} and M. Matloubian and Plant, \{D. V.\} and M. Martin and F. Oshita",

year = "1991",

doi = "10.1109/IRSSE.1991.665293",

language = "English",

series = "LEOS Summer Topical Meeting",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "11--12",

booktitle = "1991 Summer Topical Meetings on Spaceborne Photonics",

note = "1991 Summer Topical Meetings on Spaceborne Photonics: Aerospace Applications of Lasers and Electro-Optics and Optical Millimeter-Wave Interactions: Measurements, Generation, Transmission and Control ; Conference date: 24-07-1991 Through 26-07-1991",

}

Fetterman, HR, Matloubian, M, Plant, DV, Martin, M & Oshita, F 1991, Picosecond testing and evaluation of three terminal devices. in 1991 Summer Topical Meetings on Spaceborne Photonics: Aerospace Applications of Lasers and Electro-Optics and Optical Millimeter-Wave Interactions: Measurements, Generation, Transmission and Control., 665293, LEOS Summer Topical Meeting, vol. 1991-July, Institute of Electrical and Electronics Engineers Inc., pp. 11-12, 1991 Summer Topical Meetings on Spaceborne Photonics: Aerospace Applications of Lasers and Electro-Optics and Optical Millimeter-Wave Interactions: Measurements, Generation, Transmission and Control, Newport Beach, United States, 07/24/91. https://doi.org/10.1109/IRSSE.1991.665293

Picosecond testing and evaluation of three terminal devices. / Fetterman, H. R.; Matloubian, M.; Plant, D. V. et al.
1991 Summer Topical Meetings on Spaceborne Photonics: Aerospace Applications of Lasers and Electro-Optics and Optical Millimeter-Wave Interactions: Measurements, Generation, Transmission and Control. Institute of Electrical and Electronics Engineers Inc., 1991. p. 11-12 665293 (LEOS Summer Topical Meeting; Vol. 1991-July).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Picosecond testing and evaluation of three terminal devices

AU - Fetterman, H. R.

AU - Matloubian, M.

AU - Plant, D. V.

AU - Martin, M.

AU - Oshita, F.

PY - 1991

Y1 - 1991

UR - https://www.scopus.com/pages/publications/85067840862

U2 - 10.1109/IRSSE.1991.665293

DO - 10.1109/IRSSE.1991.665293

M3 - Conference contribution

AN - SCOPUS:85067840862

T3 - LEOS Summer Topical Meeting

SP - 11

EP - 12

BT - 1991 Summer Topical Meetings on Spaceborne Photonics

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 1991 Summer Topical Meetings on Spaceborne Photonics: Aerospace Applications of Lasers and Electro-Optics and Optical Millimeter-Wave Interactions: Measurements, Generation, Transmission and Control

Y2 - 24 July 1991 through 26 July 1991

ER -

Fetterman HR, Matloubian M, Plant DV, Martin M, Oshita F. Picosecond testing and evaluation of three terminal devices. In 1991 Summer Topical Meetings on Spaceborne Photonics: Aerospace Applications of Lasers and Electro-Optics and Optical Millimeter-Wave Interactions: Measurements, Generation, Transmission and Control. Institute of Electrical and Electronics Engineers Inc. 1991. p. 11-12. 665293. (LEOS Summer Topical Meeting). doi: 10.1109/IRSSE.1991.665293

Picosecond testing and evaluation of three terminal devices

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