Physics of increased edge electron temperature and density turbulence during ELM-free QH-mode operation on DIII-D

C. Sung, T. L. Rhodes, G. M. Staebler, Z. Yan, G. R. McKee, S. P. Smith, T. H. Osborne, W. A. Peebles

Research output: Contribution to journalArticlepeer-review

Abstract

For the first time, we report increased edge electron temperature and density turbulence levels (Te and ñe) in Edge Localized Mode free Quiescent H-mode (ELM-free QH-mode) plasmas as compared to the ELMing time period. ELMs can severely damage plasma facing components in fusion plasma devices due to their large transient energy transport, making ELM-free operation a highly sought after goal. The QH-mode is a candidate for this goal as it is ELM-free for times limited only by hardware constraints. It is found that the driving gradients decrease during the QH-mode compared to the ELMing phase, however, a significant decrease in the ExB shearing rate is also observed that taken together is consistent with the increased turbulence. These results are significant as the prediction and control of ELM-free H-mode regimes are crucial for the operation of future fusion devices such as ITER. The changes in the linear growth rates calculated by CGYRO [Candy et al., J. Comput. Phys. 324, 73 (2016)] and the measured ExB shearing rate between ELMing and QH-mode phases are qualitatively consistent with these turbulence changes. Comparison with ELMing and 3D fields ELM suppressed H-mode finds a similar increase in Te and ñe, however, with distinctly different origins, the increased driving gradients rather than the changes in the ExB shearing rate in 3D fields ELM suppressed the H-mode. However, linear gyrokinetic calculation results are generally consistent with the increased turbulence in both ELM-controlled discharges.

Original languageEnglish
Article number055904
JournalPhysics of Plasmas
Volume25
Issue number5
DOIs
StatePublished - May 1 2018
Externally publishedYes

Funding

This work supported by U.S. DOE under Grant Nos. DE-FG02-08ER54984 and DE-FC02-04ER54698.

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